693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Ramonda, Michel
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (15/15 displayed)
- 2023Epitaxial Growth of III‐Vs on On‐Axis Si: Breaking the Symmetry for Antiphase Domains Control and Buryingcitations
- 2022Crystal Phase Control during Epitaxial Hybridization of III‐V Semiconductors with Siliconcitations
- 2022Crystal Phase Control during Epitaxial Hybridization of III‐V Semiconductors with Siliconcitations
- 2022Growth-Induced Wrinkles and Dotlike Patterns of a Swollen Fluoroalkylated Thin Film by the Reaction of Surface-Attached Polymethylhydrosiloxanecitations
- 2021High-resolution electrical characterization of RuO2-borosilicate glass compositescitations
- 2021Photo-Cross-Linked Poly(trimethylene carbonate)/Poly(ε-caprolactone) Triblock Copolymers with Controlled Architectures: From Phase-Separated Structures to Shape-Memory Materialscitations
- 2021Crystal Phase Control during Epitaxial Hybridization of III‐V Semiconductors with Siliconcitations
- 2020Influence of Nanostructuration on the Vibrational, Electronic and Optical Properties of CrSi 2 Thin Filmscitations
- 2020Influence of Nanostructuration on the Vibrational, Electronic and Optical Properties of CrSi<sub>2</sub> Thin Filmscitations
- 2018Nanodielectric model samples to assess the detectability of interphases with Electrostatic Force Microscopy
- 2018Electrostatic force microscopy for the accurate characterization of interphases in nanocompositescitations
- 2017Raman spectra of indented pristine and irradiated sodium borosilicate glassescitations
- 2010Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopycitations
- 2009Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM
- 2009Quantitative determination of the local dielectric permittivity of ultrathin films at Nanoscale by means of Electrostatic Force Microscopy
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