693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Munteanu, Daniela
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Topics
Publications (8/8 displayed)
- 2016Functional behaviour of TiO2 films doped with noble metalscitations
- 2015Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputteringcitations
- 2014Tantalum oxynitride thin films: Mechanical properties and wear behavior dependence on growth conditionscitations
- 2010Effects of gate stack parasitic charge on current-voltage characteristics of high-k/SiO2/Ge-channel Double-Gate MOSFETs
- 2009Electron transport through high-kappa dielectric barriers: A non-equilibrium Green's function (NEGF) studycitations
- 2007Impact of high-permittivity dielectrics on speed performances and power consumption in double-gate-based CMOS circuitscitations
- 2005Performance degradation induced by fringing field-induced barrier lowering and parasitic charge in double-gate metal-oxide-semiconductor field-effect transistors with high-kappa dielectricscitations
- 2004Treatment of Point Defects in Nanowire MOSFETs Using the Nonequilibrium Green's Function Formalismcitations
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