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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Martin, T.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2024Effect of grain boundary misorientation and carbide precipitation on damage initiation: a coupled crystal plasticity and phase field damage studycitations
- 2022XIDER: a novel X-ray detector for the next generation of high-energy synchrotron radiation sourcescitations
- 2021Andreev reflection of fractional quantum Hall quasiparticlescitations
- 2021Andreev reflection of fractional quantum Hall quasiparticlescitations
- 2019The effect of phase chemistry on the extent of strengthening mechanisms in model Ni-Cr-Al-Ti-Mo based superalloyscitations
- 2019Microscopic theory of spin transport at the interface between a superconductor and a ferromagnetic insulatorcitations
- 2019Understanding irradiation-induced nanoprecipitation in zirconium alloys using parallel TEM and APTcitations
- 2017Precipitation in a novel maraging steel F1E:A study of austenitization and aging using small angle neutron scatteringcitations
- 2017Ultra-broad-band electrical spctroscopy of soils and sediments - a combined permittivity and conductivity modelcitations
- 2016Atomic-scale studies of uranium oxidation and corrosion by water vapourcitations
- 2016Epitaxial growth of gadolinium and lutetium-based aluminum perovskite thin films for X-ray micro-imaging applicationscitations
- 2009Structured scintillators for X-ray imaging with micrometre resolutioncitations
- 2009Reducing Thermal Resistance of AlGaN/GaN Electronic Devices Using Novel Nucleation Layerscitations
- 2008Raman-IR micro-thermography tool for reliability and failure analysis of electronic devicescitations
Places of action
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