693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Thomas, O.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2021Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction studycitations
- 2018In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallizationcitations
- 2018In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowirecitations
- 2017In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin films
- 2017Study of the microstructure and stress induced during the crystallization of GeTe thin films
- 2017A Complex Interrelationship between Temperature-Dependent Polyquaterthiophene (PQT) Structural and Electrical Propertiescitations
- 2017Correlating the silicon surface passivation to the nanostructure of low-temperature a-Si:H after rapid thermal annealingcitations
- 2017Piezoelectric response and electrical properties of Pb(Zr<inf>1-x</inf>Ti<inf>x</inf>)O<inf>3</inf> thin films: The role of imprint and compositioncitations
- 2016Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurementscitations
- 2013Referred paper presented at 6th Size strain international conference diffraction analysis of the microstructure of materials in Thin Solid Films
- 2010Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregatescitations
- 2007Chapter 6 Physical and aggregate propertiescitations
- 2005Mechanical characterization of low-k and barrier dielectric thin filmscitations
- 2002Influence of segregation on the measurement of stress in thin filmscitations
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