Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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PeopleLocationsStatistics
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Richard, M.-I.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2021Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction study17citations
  • 2019Measurement of local strain7citations
  • 2018In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization12citations
  • 2018In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire15citations
  • 2017In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin filmscitations
  • 2017Study of the microstructure and stress induced during the crystallization of GeTe thin filmscitations
  • 2011Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis15citations

Places of action

Chart of shared publication
Arnaud, F.
1 / 1 shared
Putero, M.
1 / 1 shared
Mocuta, C.
4 / 17 shared
Boivin, P.
1 / 4 shared
Thomas, O.
5 / 14 shared
Gammer, C.
1 / 27 shared
Eberl, C.
1 / 25 shared
Burle, N.
3 / 3 shared
Amara, M. S.
3 / 3 shared
Guichet, C.
3 / 4 shared
Gallard, M.
3 / 5 shared
Noé, P.
3 / 4 shared
Escoubas, S.
3 / 6 shared
Bernard, M.
1 / 5 shared
Yahia, B. Ben
1 / 1 shared
Putero, Magali
3 / 12 shared
Chahine, R.
1 / 2 shared
Fellouh, L.
1 / 1 shared
Sabbione, C.
3 / 6 shared
Shin, J.
1 / 7 shared
Richter, G.
1 / 13 shared
Blanchard, Nicholas
1 / 20 shared
Cornelius, T.
1 / 2 shared
Labat, S.
1 / 4 shared
Lauraux, F.
3 / 3 shared
Gianola, D.
1 / 2 shared
Hippert, F.
2 / 7 shared
Metzger, T.-H.
1 / 1 shared
Holý, V.
1 / 16 shared
Holmström, E.
1 / 3 shared
Xie, Y.-H.
1 / 1 shared
Favre-Nicolin, V.
1 / 5 shared
Yoon, T.-S.
1 / 1 shared
Rouvière, J.-L.
1 / 1 shared
Nordlund, K.
1 / 23 shared
Renaud, Gilles
1 / 17 shared
Chart of publication period
2021
2019
2018
2017
2011

Co-Authors (by relevance)

  • Arnaud, F.
  • Putero, M.
  • Mocuta, C.
  • Boivin, P.
  • Thomas, O.
  • Gammer, C.
  • Eberl, C.
  • Burle, N.
  • Amara, M. S.
  • Guichet, C.
  • Gallard, M.
  • Noé, P.
  • Escoubas, S.
  • Bernard, M.
  • Yahia, B. Ben
  • Putero, Magali
  • Chahine, R.
  • Fellouh, L.
  • Sabbione, C.
  • Shin, J.
  • Richter, G.
  • Blanchard, Nicholas
  • Cornelius, T.
  • Labat, S.
  • Lauraux, F.
  • Gianola, D.
  • Hippert, F.
  • Metzger, T.-H.
  • Holý, V.
  • Holmström, E.
  • Xie, Y.-H.
  • Favre-Nicolin, V.
  • Yoon, T.-S.
  • Rouvière, J.-L.
  • Nordlund, K.
  • Renaud, Gilles
OrganizationsLocationPeople