693.932 PEOPLE
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Mocuta, C.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (17/17 displayed)
- 2024Study of the amorphous and crystalline states in Ge(Te1-xSex) thick films (x = 0, 0.50) by in situ temperature-dependent structural analysescitations
- 2023In situ study of the crystallization in GeTe0.26 Se0.74 thick film by synchrotron X-ray diffractioncitations
- 2021Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction studycitations
- 2021Estimation of stress in specimens loaded with ultrasonic fatigue machinescitations
- 2020Ultrafast transient liquid assisted growth of high current density superconducting films
- 2019Microsecond time-resolved X-ray diffraction for the investigation of fatigue behavior during ultrasonic fatigue loading
- 2019Study of uniaxial deformation behavior of 50 nm-thick thin film of gold single crystal using in situ X-ray pole figure measurementscitations
- 2018In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallizationcitations
- 2017Piezoelectric response and electrical properties of Pb(Zr 1-x Ti x )O 3 thin films: The role of imprint and compositioncitations
- 2017In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin films
- 2017Study of the microstructure and stress induced during the crystallization of GeTe thin films
- 2017Piezoelectric response and electrical properties of Pb(Zr<inf>1-x</inf>Ti<inf>x</inf>)O<inf>3</inf> thin films: The role of imprint and compositioncitations
- 2016Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurementscitations
- 2015In situ characterization of microstructural instabilities: Recovery, recrystallization and abnormal growth in nanoreinforced steel powdercitations
- 2015Antiferromagnetic long-range spin ordering in Fe- and NiFe2-doped BaTiO3 multiferroic layerscitations
- 2014Comparative study of the mechanical properties of nanostructured thin films on stretchable substratescitations
- 2008Versatile vacuum chamber for in situ surface X-ray scattering studiescitations
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