693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Gergaud, P.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (15/15 displayed)
- 2024A comparative study of C, N and Xe pre-amorphization implantation processes for improving the thermal stability of NiSi films
- 2024Enhancing superconductivity in CoSi2 films with laser annealing
- 2021Enhanced thermal stability of Ni/GeSn system using pre-amorphization by implantationcitations
- 2021Influence of dual Ge/C pre-amorphization implantation on the Ni1−Pt Si phase nucleation and growth mechanismscitations
- 2020Grazing-incidence X-ray fluorescence analysis of thin chalcogenide materials deposited on Bragg mirrorscitations
- 2018Understanding and improving the low optical emission of InGaAs quantum wells grown on oxidized patterned (001) silicon substratecitations
- 2018Anti phase boundary free GaSb layer grown on 300 mm (001)-Si substrate by metal organic chemical vapor depositioncitations
- 2018Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instrumentscitations
- 2016Formation and stability of intermetallics formed by solid-state reaction of Ni on In0.53Ga0.47As
- 2014Microstrain and residual stress in thin-films made from silver nanoparticles deposited by inkjet-printing technology:
- 2013Realization and characterization of thin single crystal Ge films on sapphirecitations
- 2013Low temperature oxidation mechanisms of nanocrystalline magnetite thin filmcitations
- 2012Demonstration of single crystal GaAs layers on CTE-matched substrates by the Smart Cut technologycitations
- 2005Mechanical characterization of low-k and barrier dielectric thin filmscitations
- 2002Influence of segregation on the measurement of stress in thin filmscitations
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