693.932 PEOPLE
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Barnes, Jean-Paul
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (17/17 displayed)
- 2024Tracking Hydrogen During Poly-Si/SiOx Contact Fabrication: An Infrared Spectroscopy Analysis of Si–H Bonds Configurations
- 2023Microelectronic applications of in-situ FIB sectioning in the TOF-SIMS
- 2023Epitaxy of Group-IV Semiconductors for Quantum Electronicscitations
- 2023The importance of sample preparation in time-of-flight secondary ion mass spectrometry analysis for semiconductor applications
- 2023Correlative analysis of beam and air-sensitive materials using TOF-SIMS, SEM and XPS
- 2023N-doping of electron transport layers in organic light-emitting diodes studied by combining TOF-SIMS and XPS
- 2023Correlative analysis using time-of-flight secondary ion mass spectrometry for beam sensitive samples
- 2022A multiscale study of the structure, chemistry and ferroelectric properties of epitaxial sol-gel PbZr0.2Ti0.8O3 films for nanomechanical switching
- 2022A multiscale study of the structure, chemistry and ferroelectric properties of epitaxial sol-gel PbZr0.2Ti0.8O3 films for nanomechanical switching
- 2022Correlative microscopy and data analysis for semiconductor technology applications
- 2021Correlative surface microscopy for healthcare technologies
- 2021Structure, chemical analysis, and ferroelectric properties of chemical solution derived epitaxial PbZr$_{0.2}$Ti$_{0.8}$O$_3$ films for nanomechanical switching
- 2021Structure, chemical analysis, and ferroelectric properties of chemical solution derived epitaxial PbZr$_{0.2}$Ti$_{0.8}$O$_3$ films for nanomechanical switching
- 20193D imaging of nanoparticles in an inorganic matrix using TOF-SIMS validated with STEM and EDXcitations
- 2017ToF-SIMS Depth Profiling of PS- b -PMMA Block Copolymers Using Ar n + , C 60 ++ , and Cs + Sputtering Ionscitations
- 2010Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantationcitations
- 2008Structural properties of tensile-strained Si layers grown on Si 1− x Ge x virtual substrates ( x = 0.2, 0.3, 0.4 and 0.5)citations
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