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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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David, Adrian
General Electric (Finland)
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2023Modeling of SrTiO3 polycrystalline substrate grain growth for tuning thin film functional propertiescitations
- 2023Scanning precession electron tomography (SPET) for structural analysis of thin films along their thicknesscitations
- 2023Artificial Aging of Thin Films of the Indium-Free Transparent Conducting Oxide SrVO 3citations
- 2023Structural, optical, and electrical properties of TiO$_2$ thin films deposited by ALD: Impact of the substrate, the deposited thickness and the deposition temperaturecitations
- 2023Controlling mesenchymal stem cell differentiation using vanadium oxide thin film surface wettabilitycitations
- 2022Tunable magnetic and magnetotransport properties in locally epitaxial La 0.67 Sr 0.33 MnO 3 thin films on polycrystalline SrTiO 3 , by control of grain sizecitations
- 2021Highly Transparent and Conductive Indium‐Free Vanadates Crystallized at Reduced Temperature on Glass Using a 2D Transparent Nanosheet Seed Layercitations
- 2020Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrixcitations
- 2019Tuning of the Optical Properties of the Transparent Conducting Oxide SrVO3 by Electronic Correlationscitations
- 2019Precession electron diffraction tomography on twinned crystals: application to CaTiO 3 thin filmscitations
- 2017Chemical Strain Engineering of Magnetism in Oxide Thin Filmscitations
- 2016Monitoring the growth of SrTiO 3 and La 0.66 Sr 0.33 MnO 3 thin films using a low-pressure Reflection High Energy Electron Diffraction systemcitations
Places of action
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