People | Locations | Statistics |
---|---|---|
Naji, M. |
| |
Motta, Antonella |
| |
Aletan, Dirar |
| |
Mohamed, Tarek |
| |
Ertürk, Emre |
| |
Taccardi, Nicola |
| |
Kononenko, Denys |
| |
Petrov, R. H. | Madrid |
|
Alshaaer, Mazen | Brussels |
|
Bih, L. |
| |
Casati, R. |
| |
Muller, Hermance |
| |
Kočí, Jan | Prague |
|
Šuljagić, Marija |
| |
Kalteremidou, Kalliopi-Artemi | Brussels |
|
Azam, Siraj |
| |
Ospanova, Alyiya |
| |
Blanpain, Bart |
| |
Ali, M. A. |
| |
Popa, V. |
| |
Rančić, M. |
| |
Ollier, Nadège |
| |
Azevedo, Nuno Monteiro |
| |
Landes, Michael |
| |
Rignanese, Gian-Marco |
|
Delobelle, Patrick
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (26/26 displayed)
- 2023Thermo-magneto-mechanical properties of near stoichiometric Ni2MnGa (Mn > Ga) thin films deposited by radio-frequency magnetron sputtering on Si substrate
- 2020Identifiability of single crystal plasticity parameters from residual topographies in Berkovich nanoindentation on FCC nickelcitations
- 2018Single crystal plasticity parameters identification from residual imprint topography after nano-indentation
- 2018Identification of the viscoelastic properties of the tBA/PEGDMA polymer from multi-loading modes conducted over a wide frequency–temperature scale range
- 2016Advantages of a 3-parameter reduced constitutive model for the measurement of polymers elastic modulus using tensile testscitations
- 2016Sensitivity of the residual topography to single crystal plasticity parameters in Berkovich nanoindentation on FCC nickel
- 2016Modeling and characterization of piezoelectric beams based on an aluminum nitride thin-film layercitations
- 2015Mechanical properties of bulk polydimethylsiloxane for microfluidics over a large range of frequencies and aging times
- 2014Anisotropy and crystal plasticity analysis of a FCC nickel polycrystal by nanoindentation and numerical modeling
- 2014Failure of nano-structured optical fibers by femtosecond laser procedure as a safety sensor for composite materials applications
- 2014Microstructural and elasto-plastic material parameters identification by inverse finite elements method of Ti(1-x) AlxN (0 < x < 1 sputtered thin films from Berkovich nano-indentation experimentscitations
- 2013Failure of multimode optical fibers nano-structured by near ablation threshold single-shot femtosecond laser procedurecitations
- 2013Resistance welding of NiTi shape memory alloy tubescitations
- 2013Simultaneous measurement of Young's modulus and Poisson's ratio at microscale with multimode scanning microdeformation microscopy and full-field measurements
- 2013Rapid prototyping of magnetic valve based on nanocomposite Co/PDMS membranecitations
- 2011A detailed study through the focal region of near-threshold single-shot femtosecond laser ablation nano-holes in borosilicate glasscitations
- 2011Interprétation du module d'indentation dans le cas des matériaux anisotropes et/ou actifscitations
- 2011A detailed study through the focal region of near-threshold single-shoy femtosecond laser ablation nano-holes in borosilicate glasscitations
- 2010Identification Of The True Elastic Modulus Of High Density Polyethylene From Tensile Tests Using An Appropriate Reduced Model Of The Elastoviscoplastic Behavior
- 2009Microstructural mechanical and magnetic properties of shape memory alloy Nisr Mn23 Gr22 thin films deposited by radio-frequency magnetron sputteringcitations
- 2008Scanning microdeformation microscopy: sensitivity study and application to mechanical characterization of soft materialcitations
- 2006Effect of the residual stress on the determination through nanoindentation technique of the Young's modulus of W thin film deposit on Si02/Si substrate
- 2006Mechanical properties determined by nanoindentation tests of Pb(Zr,Ti)03 and Pb(Mg,Nb)Ti03 sputtered thin films
- 2005Nanoindentation of chromium zigzag thin films sputter depositedcitations
- 2004Influence of Zig-Zag microstructure on mechanical and electrical properties of chromium multilayered thin films
- 2004Evaluation of the mechanical properties of square membranes prestressed by PECVD silicon oxynitride thin filmscitations
Places of action
Organizations | Location | People |
---|