693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Jonnard, Philippe
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2023X-ray spectroscopy of lithium
- 2021Study of buried interfaces in Fe/Si multilayer by hard x-ray emission spectroscopy
- 2020New Insights into the Structure and Degradation of Alizarin Lake Pigments: Input of the Surface Study Approachcitations
- 2019Prospects concerning 1D photonic crystals in the X-ray range
- 2018Characterization of interfacial chemical processes in Pd/Y multilayers using HAXPES induced by standing waves
- 2017Application of x-ray standing waves for the characterization of chemical processes and interfacial diffusion in Pd/Y based multilayers using HAXPES
- 2015Inter-laboratory comparison of a WDS-EDS quantitative X-ray microanalysis of a metallic glasscitations
- 2011Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applicationscitations
- 2010Structural properties of Al/Mo/SiC multilayers with high reflectivity for extreme ultraviolet light
- 2009Spectroscopic study of interfaces in Al/Ni periodic multilayerscitations
- 2009Electronic structure of Ni and Mo silicides investigated by x-ray emission spectroscopy and density functional theorycitations
- 2009Characterization of Al and Mg Alloys from Their X-Ray Emission Bandscitations
- 2005X-ray reflection spectroscopy of the HfO2/SiO2/Si system in the region of the O-K absorption edge
- 2004SOLEX: a tunable monochromatic X-ray source in the 1–20keV energy range for metrology ; SOLEX : une source x monochromatique accordable entre 1 et 20 keV pour la métrologiecitations
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