693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Dahoo, Pierre-Richard
in Cooperation with on an Cooperation-Score of 37%
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Publications (10/10 displayed)
- 2021Volume 9 : Applications and Metrology at Nanometer Scale 1 ; Volume 9 : Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
- 2020UVSQ-SAT, a Pathfinder CubeSat Mission for Observing Essential Climate Variablescitations
- 2017Edge Effect on Nanoparticles of an Interconnect Alloy from the ABV Model
- 2016Comparison of NIR to MIR Optical Constants of Polymers for Packaging by Spectroscopic Ellipsometry
- 2014Spark Plasma Sintering constrained process parameters of sintered silver paste for connection in power electronic modules: Microstructure, mechanical and thermal propertiescitations
- 2013Optical and electrical characterization of Ni-doped orthoferrites thin films prepared by sol-gel processcitations
- 2013A thermo-mechanical cohesive zone model for solder joint lifetime predictioncitations
- 2010Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth rates
- 2009Modelling optical ellipsometric parameters perovskite oxides thin films deposited by pulsed laser
- 2008Spectroscopic ellipsometry investigations of the thermally induced first-order transition of RbMn[Fe(CN) 6 ]citations
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