Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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PeopleLocationsStatistics
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (12/12 displayed)

  • 2016Intra-stack sealing of tier interconnects using the interconnect alloy4citations
  • 2015Nanoparticle assembly and sintering towards all-copper flip chip interconnects34citations
  • 2011Delamination Toughness of Cu-EMC Interfaces at Harsh Environmentcitations
  • 2011Temperature moisture and mode mixity dependent EMC-Copper (oxide) interfacial toughnesscitations
  • 2010Delamination and combined compound cracking of EMC-copper interfacescitations
  • 2010Temperature moisture and mode mixity dependent EMC- Copper (Oxide) interfacial toughnesscitations
  • 2010Interfacial fracture parameters of silicon-to-molding compoundcitations
  • 2010Procedure to determine interfacial toughness of EMC-copper (oxide) interfacescitations
  • 2009How to fabricate specimens for silicon-to-molding compound interface adhesion measurements8citations
  • 2009Establishing mixed mode fracture properties of EMC-copper (-oxide) interfaces at various temperatures13citations
  • 2009Establishing mixed mode fracture properties of EMC-copper (-oxide) interfaces at various temperatures13citations
  • 2008Mixed mode interface characterization considering thermal residual stress8citations

Places of action

Chart of shared publication
Brunschwiler, T.
2 / 4 shared
Keller, J.
1 / 13 shared
Kleff, Jessica
1 / 1 shared
Mrossko, R.
1 / 4 shared
Steller, W.
1 / 2 shared
Oppermann, H.
1 / 12 shared
Warszynski, P.
1 / 2 shared
Wunderle, Bernhard
1 / 19 shared
Zürcher, J.
1 / 2 shared
Yu, K.
1 / 3 shared
Taklo, M. M. V.
1 / 2 shared
Baum, Mario
1 / 6 shared
Sadeghinia, M.
1 / 2 shared
Jansen, Kaspar
4 / 48 shared
Pape, H.
10 / 13 shared
Ernst, Lj
4 / 26 shared
Jansen, K. M. B.
4 / 19 shared
Xiao, A.
8 / 12 shared
Ernst, L. J.
4 / 15 shared
Wunderle, B.
8 / 32 shared
Walter, H.
1 / 25 shared
Maus, I.
1 / 2 shared
Wunderle, W.
1 / 1 shared
Leung, Yy
1 / 1 shared
Ernst, L.
1 / 1 shared
Ernst, Lj Leo
1 / 2 shared
Jansen, Kmb
1 / 2 shared
Sluis, O. Van Der
1 / 9 shared
Sluis, Van Der, O.
1 / 16 shared
Chart of publication period
2016
2015
2011
2010
2009
2008

Co-Authors (by relevance)

  • Brunschwiler, T.
  • Keller, J.
  • Kleff, Jessica
  • Mrossko, R.
  • Steller, W.
  • Oppermann, H.
  • Warszynski, P.
  • Wunderle, Bernhard
  • Zürcher, J.
  • Yu, K.
  • Taklo, M. M. V.
  • Baum, Mario
  • Sadeghinia, M.
  • Jansen, Kaspar
  • Pape, H.
  • Ernst, Lj
  • Jansen, K. M. B.
  • Xiao, A.
  • Ernst, L. J.
  • Wunderle, B.
  • Walter, H.
  • Maus, I.
  • Wunderle, W.
  • Leung, Yy
  • Ernst, L.
  • Ernst, Lj Leo
  • Jansen, Kmb
  • Sluis, O. Van Der
  • Sluis, Van Der, O.
OrganizationsLocationPeople