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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Imhoff, Luc
Laboratoire Bourguignon des Matériaux et Procédés
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2024Tribochemistry dependence of Ni62Nb33Zr5 bulk metallic glass on the Cr content of steel counterparts
- 2022Tribochemical study of Ni62Nb33Zr5 metallic glass depending on the Cr content of steel counterparts
- 2014Flash annealing influence on structural and electrical properties of TiO2/TiO/Ti periodic multilayerscitations
- 2014Structural and electrical properties in tungsten/tungsten oxide multilayerscitations
- 2013The interdependence of structural and electrical properties in TiO2/TiO/Ti periodic multilayerscitations
- 2013Interdependence of structural and electrical properties in tantalum/tantalum oxide multilayerscitations
- 2012Structural analysis of W3O/WO3 and TiO/TiO2 periodic multilayer thin films sputter deposited by the reactive gas pulsing processcitations
- 2012Structural analysis of W3O/WO3 and TiO/TiO2 periodic multilayer thin films sputter deposited by the reactive gas pulsing processcitations
- 2012Sputtered Tungsten-Based Ternary and Quaternary Layers for Nanocrystalline Diamond Depositioncitations
- 2012Growth of WC-Cr-N and WC-Al-N coatings in a RF-magnetron sputtering processcitations
- 2012Sputtered tungsten-based ternary and quaternary layers for nanocrystalline diamond depositioncitations
- 2009Physical and Mechanical Properties of CrAlN and CrSiN Ternary Systems for Wood Machining Applicationscitations
- 2006Phase mixture in MOCVD and reactive sputtering TiOxNy thin films revealed and quantified by XPS factorial analysis.citations
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