693.932 PEOPLE
| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Sadiq, Muhammad
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2021Enhanced energy storage properties of La<sup>3+</sup> modified 0.92Bi<sub>0.5</sub>Na<sub>0.5</sub>TiO<sub>3</sub> -0.06Ba(Zr<sub>0.2</sub>Ti<sub>0.8</sub>)O<sub>3</sub>-0.02NaNbO<sub>3</sub> ternary ceramic systemcitations
- 2021Experimental validation of bulk-graphene as a thermoelectric generatorcitations
- 2021Evaluation of BaCo0.Fe-4(0).4Zr0.2-xNixO3-delta perovskite cathode using nickel as a sintering aid for IT-SOFCcitations
- 2015Individual Phase Mechanical Properties at Different Temperatures of Sn–Ag–Cu Lead-Free Solders Incorporating Special Pileup Effects Using Nanoindentationcitations
- 2015Individual Phase Mechanical Properties at Different Temperatures of Sn-Ag-Cu Lead-Free Solders Incorporating Special Pileup Effects Using Nanoindentationcitations
- 2013Reduced penetration force through ultrasound activation of a standard needlecitations
- 2013Impact of Thermal Aging on the Microstructure Evolution and Mechanical Properties of Lanthanum-Doped Tin-Silver-Copper Lead-Free Solderscitations
- 2012Design and Fabrication of Next-Generation Lanthanum-Doped Lead-free Solder for Reliable Microelectronics Applications in Severe Environment ; Conception et fabrication d'une nouvelle génération de soudures sans plomb dopés en lanthane pour des applications microélectroniques fiables en environnement sévère
Places of action
| Organizations | Location | People |
|---|