693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Thiel, Karsten
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (10/10 displayed)
- 2024Feasibility Study on the Generation of Nanoporous Metal Structures by Means of Selective Alloy Depletion in Halogen-Rich Atmospheres
- 2022Ultrahigh sulfur loading tolerant cathode architecture with extended cycle life for high energy density lithium–sulfur batteriescitations
- 2022Application of Poly-L-Lysine for Tailoring Graphene Oxide Mediated Contact Formation between Lithium Titanium Oxide LTO Surfaces for Batteriescitations
- 2022Application of Poly-L-Lysine for Tailoring Graphene Oxide Mediated Contact Formation between Lithium Titanium Oxide LTO Surfaces for Batteriescitations
- 2021An in vitro bone-to-bone adhesion test method using the compression shear testcitations
- 2021Highly porous nanocoatings tailored for inverse nanoparticle‐polymer compositescitations
- 2021Study of anodic oxide films formed on solid-state sintered SiC-ceramic at high anodic potentialscitations
- 2017Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performancecitations
- 2016Functional pressure-sensitive adhesive tapes for local anodization of aluminium surfacescitations
- 2013Strukturelle Untersuchung der amorph/kristallinen Grenzfläche mittels quantitativer hochauflösender Transmissionselektronenmikroskopie an den Systemen a-Si/c-Si und a-Ge/c-Si ; Structural investigation of the amorphous/crystalline interface by means of quantitative high-resolution transmission electron microscopy on the systems a-Si/c-Si and a-Ge/c-Si
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