693.932 PEOPLE
| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Rommel, Mathias
Fraunhofer Institute for Integrated Systems and Device Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2024Novel Rapid and Deposition-Free Strategy for FIB Cross-Section Preparation
- 2022Via Size-Dependent Properties of TiAl Ohmic Contacts on 4H-SiCcitations
- 2020Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopycitations
- 2020Low-Resistance Ohmic Contact Formation by Laser Annealing of N-Implanted 4H-SiCcitations
- 2018Defects and carrier lifetime in 4H-Silicon Carbide ; Defects and carrier lifetime in 4H-SiC
- 2018One-step nanoimprinted Bragg grating sensor based on hybrid polymerscitations
- 2018Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopycitations
- 2015Improvement of 4H-SiC material quality
- 2015Junction formation and current transport mechanisms in hybrid n-Si/PEDOT:PSS solar cells
- 2014NanoSPV - SPM Technique for Measuring Minority Charge Carrier Diffusion Lengths with High Spatial Resolution
- 2014Optical polymers with tunable refractive index for nanoimprint technologiescitations
- 2013Evaluation of resistless Ga+ beam lithography for UV NIL stamp fabricationcitations
- 2010Full wafer microlens replication by UV imprint lithographycitations
Places of action
| Organizations | Location | People |
|---|