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| Naji, M. |
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| Petrov, R. H. | Madrid |
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Ghibaudo, Gerard
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Publications (3/3 displayed)
- 2019Impact of CMOS TiN metal gate process on microstructure and its correlation with electrical properties
- 2017Self-heating assessment and cold current extraction in FDSOI MOSFETscitations
- 2016Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance techniquecitations
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