693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Schamm-Chardon, Sylvie
French National Centre for Scientific Research
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (26/26 displayed)
- 2023Fabrication of barium titanate nanopillars by neon ion milling
- 2023Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual latticecitations
- 2022Fabrication of barium titanate nanopillars by neon ion milling
- 2022Nano-composite MOx materials for NVMscitations
- 2021Fabrication by neon ion milling and characterization of barium titanate nanopillars
- 2019Structural and chemical investigation of interface related magnetoelectric effect in Ni/BiFe0.95Mn0.05O3 heterostructurescitations
- 2018Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopycitations
- 2018Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopycitations
- 2015A review of molecular beam epitaxy of ferroelectric BaTiO3 films on Si, Ge and GaAs substrates and their applicationscitations
- 2014Structural study and ferroelectricity of epitaxial BaTiO3 films on silicon grown by molecular beam epitaxycitations
- 2013Fabrication of well-ordered arrays of silicon nanocrystals using a block copolymer maskcitations
- 2011The fabrication of tunable nanoporous oxide surfaces by block copolymer lithography and atomic layer depositioncitations
- 2011Nanocrystallized tetragonal metastable ZrO2 thin films deposited by metal-organic chemical vapor deposition for 3D capacitorscitations
- 2011Structural and electrical properties of Er-doped HfO2 and of its interface with Ge (001)citations
- 2011Combining HRTEM-EELS nano-analysis with capacitance-voltage measurements to evaluate high-kappa thin films deposited on Si and Ge as candidate for future gate dielectricscitations
- 2010O-3-based atomic layer deposition of hexagonal La2O3 films on Si(100) and Ge(100) substratescitations
- 2009Chemical/Structural Nanocharacterization and Electrical Properties of ALD-Grown La2O3/Si Interfaces for Advanced Gate Stackscitations
- 2009Localized Silicon Nanocrystals Fabricated by Stencil Masked Low Energy Ion Implantation: Effect of the Stencil Aperture Size on the Implanted Dose
- 2009Characterization of ZrO2 thin films deposited by MOCVD for high-density 3D capacitors. Broad experience on MOCVD techniques and high-k materialscitations
- 2005Oxidation effects on transport characteristics of nanoscale MOS capacitors with an embedded layer of silicon nanocrystals obtained by low energy ion implantationcitations
- 2005Manipulation of 2D arrays of Si nanocrystals by ultra-low-energy ion beam-synthesis for nonvolatile memories applicationscitations
- 2005The effects of oxidation conditions on structural and electrical properties of silicon nanoparticles obtained by ultra-low-energy ion implantationcitations
- 2005Si nanocrystals by ultra-low energy ion implantation for non-volatile memory applicationscitations
- 2003Multi-scale analysis of the dielectric properties and structure of resin/carbon-black nanocompositescitations
- 2001Contamination and the quantitative exploitation of EELS low-loss experimentscitations
- 2001VUV absorption coefficient measurements of borate matricescitations
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