Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Brno University of Technology

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2024Influence of Deposition Parameters on the Plasmonic Properties of Gold Nanoantennas Fabricated by Focused Ion Beam Lithography2citations
  • 2024Efficient nanoscale imaging of solid-state phase transitions by transmission electron microscopy demonstrated on vanadium dioxide nanoparticlescitations
  • 2023A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering10citations
  • 2022Low temperature 2D GaN growth on Si(111) 7 x 7 assisted by hyperthermal nitrogen ions3citations
  • 2021Plasmonic Metasurface Resonators to Enhance Terahertz Magnetic Fields for High‐Frequency Electron Paramagnetic Resonance8citations
  • 2021Kinetics of guided growth of horizontal gan nanowires on flat and faceted sapphire surfaces5citations
  • 2021Kinetics of Guided Growth of Horizontal GaN Nanowires on Flat and Faceted Sapphire Surfaces5citations
  • 2020Single-layer graphene on epitaxial FeRh thin films12citations
  • 2020Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering:Calcium fluoride3citations

Places of action

Chart of shared publication
Foltýn, Michael
1 / 2 shared
Horák, Michal
3 / 3 shared
Řepa, Rostislav
1 / 2 shared
Patočka, Marek
1 / 1 shared
Kabát, Jiří
1 / 1 shared
Konečná, Andrea
1 / 4 shared
Kepič, Peter
1 / 1 shared
Hájek, Martin
1 / 1 shared
Ligmajer, Filip
1 / 2 shared
Křápek, Vlastimil
2 / 2 shared
Kim, Seong H.
1 / 6 shared
Brongersma, Hidde H.
2 / 4 shared
Hodges, Grant T.
1 / 1 shared
Vaníčková, Elena
1 / 1 shared
Průša, Stanislav
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Bábík, Pavel
2 / 2 shared
Linford, Matthew R.
1 / 2 shared
Avval, Tahereh G.
1 / 1 shared
Fearn, Sarah
1 / 6 shared
Cushman, Cody V.
1 / 1 shared
Čechal, Jan
2 / 6 shared
Čalkovský, Vojtěch
1 / 1 shared
Bartošík, Miroslav
1 / 1 shared
Konečný, Martin
1 / 1 shared
Mach, Jindřich
3 / 3 shared
Nezval, David
1 / 1 shared
Maniš, Jaroslav
3 / 3 shared
Kachtík, Lukáš
1 / 1 shared
Šamořil, Tomáš
1 / 4 shared
Kern, Michal
1 / 4 shared
Hrtoň, Martin
1 / 1 shared
Van Slageren, Joris
1 / 8 shared
Bloos, Dominik
1 / 2 shared
Beneš, Adam
1 / 1 shared
Hentschel, Mario
1 / 3 shared
Hillenbrand, Rainer
1 / 9 shared
Tesi, Lorenzo
1 / 3 shared
Dubrovskii, Vladimir G.
2 / 8 shared
Rothman, Amnon
2 / 11 shared
Joslevich, Ernesto
1 / 1 shared
Sirotti, F.
1 / 11 shared
Bendounan, Azzedine
1 / 15 shared
Uhlíř, Vojtěch
1 / 4 shared
Arregi Uribeetxebarria, Jon Ander
1 / 2 shared
Pressacco, Frederico
1 / 1 shared
Potoček, Michal
1 / 1 shared
Procházka, Pavel
1 / 3 shared
Chart of publication period
2024
2023
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2020

Co-Authors (by relevance)

  • Foltýn, Michael
  • Horák, Michal
  • Řepa, Rostislav
  • Patočka, Marek
  • Kabát, Jiří
  • Konečná, Andrea
  • Kepič, Peter
  • Hájek, Martin
  • Ligmajer, Filip
  • Křápek, Vlastimil
  • Kim, Seong H.
  • Brongersma, Hidde H.
  • Hodges, Grant T.
  • Vaníčková, Elena
  • Průša, Stanislav
  • Bábík, Pavel
  • Linford, Matthew R.
  • Avval, Tahereh G.
  • Fearn, Sarah
  • Cushman, Cody V.
  • Čechal, Jan
  • Čalkovský, Vojtěch
  • Bartošík, Miroslav
  • Konečný, Martin
  • Mach, Jindřich
  • Nezval, David
  • Maniš, Jaroslav
  • Kachtík, Lukáš
  • Šamořil, Tomáš
  • Kern, Michal
  • Hrtoň, Martin
  • Van Slageren, Joris
  • Bloos, Dominik
  • Beneš, Adam
  • Hentschel, Mario
  • Hillenbrand, Rainer
  • Tesi, Lorenzo
  • Dubrovskii, Vladimir G.
  • Rothman, Amnon
  • Joslevich, Ernesto
  • Sirotti, F.
  • Bendounan, Azzedine
  • Uhlíř, Vojtěch
  • Arregi Uribeetxebarria, Jon Ander
  • Pressacco, Frederico
  • Potoček, Michal
  • Procházka, Pavel
OrganizationsLocationPeople

article

Low temperature 2D GaN growth on Si(111) 7 x 7 assisted by hyperthermal nitrogen ions

  • Čalkovský, Vojtěch
  • Horák, Michal
  • Bartošík, Miroslav
  • Konečný, Martin
  • Mach, Jindřich
  • Šikola, Tomáš
  • Nezval, David
  • Maniš, Jaroslav
  • Kachtík, Lukáš
  • Šamořil, Tomáš
Abstract

As the characteristic dimensions of modern top-down devices are getting smaller, such devices reach their operational limits imposed by quantum mechanics. Thus, two-dimensional (2D) structures appear to be one of the best solutions to meet the ultimate challenges of modern optoelectronic and spintronic applications. The representative of III-V semiconductors, gallium nitride (GaN), is a great candidate for UV and high-power applications at a nanoscale level. We propose a new way of fabrication of 2D GaN on the Si(111) 7 x 7 surface using post-nitridation of Ga droplets by hyperthermal (E = 50 eV) nitrogen ions at low substrate temperatures (T < 220 degrees C). The deposition of Ga droplets and their post-nitridation are carried out using an effusion cell and a special atom/ion beam source developed by our group, respectively. This low-temperature droplet epitaxy (LTDE) approach provides well-defined ultra-high vacuum growth conditions during the whole fabrication process resulting in unique 2D GaN nanostructures. A sharp interface between the GaN nanostructures and the silicon substrate together with a suitable elemental composition of nanostructures was confirmed by TEM. In addition, SEM, X-ray photoelectron spectroscopy (XPS), AFM and Auger microanalysis were successful in enabling a detailed characterization of the fabricated GaN nanostructures.

Topics
  • Deposition
  • impedance spectroscopy
  • surface
  • scanning electron microscopy
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • Nitrogen
  • nitride
  • transmission electron microscopy
  • Silicon
  • two-dimensional
  • Gallium
  • III-V semiconductor