• Salski, Bartłomiej Wacław
• Krupka, Jerzy
• Kopyt, Paweł
• Karpisz, Tomasz

Abstract

It is shown in this paper that a Fabry-Perot open resonator can be applicable to broadband characterization of low-loss dielectric materials exploited in 5G telecommunications. Although the concept of the method had been known for years, only recently a novel approach to the measurement procedure been proposed, which allows reducing measurement inaccuracy at no cost of increased computational effort. For that purpose, a new scalarone-dimensional electromagnetic model of the resonator has been proposed, the results of which are compared with measured data to evaluate, in turn, the unknown complex permittivity of a sample.Another challenge that has been solved is robust mode identification and tracking, which is essential due to the fact that the resonator is electrically long, so there are plenty of spurious modes. The whole measurement process is fully automated so that the only needed user intervention is insertion of the sample, which should be in theform of a laminate with the diameter of over 3 inches. The operation of the system is shown by measuring materials well-known in 5 G applications, such as silicon or fused silica.

Topics

• impedance spectroscopy
• Silicon