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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Geyer, Richard G.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2006Variable-temperature microwave dielectric properties of singlecrystal fluorides
- 2005Microwave dielectric properties of single-crystal quantum paraelectrics and at cryogenic temperaturescitations
- 2004Dielectric characterization of single-crystal LiF, CaF 2, MgF 2, BaF 2 , and SrF 2 at microwave frequencies
- 2002Microwave Dielectric Property Measurements
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booksection
Microwave Dielectric Property Measurements
Abstract
Materials, whether in the solid, liquid or gaseous states, may be electrically nonlinear, anisotropic, inhomogeneous and dispersive with respect to frequency. Dispersion results from loss mechanisms that differ in different types of materials and vary with temperature. Dielectric loss tangent measurements reflect the different loss mechanisms occurring in a material place in an electric field. Because of all these factors, both measurement techniques and accuracies for evaluation of dielectric properties are requisite for physical understanding. Various permittivity and dielectric loss tangent measurement techniques, including low-frequency complex impedance, free space, waveguide transmission and reflection, and resonance methods are reviewed. Measurement uncertainties are also discussed.