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Jacob, Mohan V.
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Publications (15/15 displayed)
- 2023Antimicrobial graphene-based coatings for biomedical implant applicationscitations
- 2022Plasma polymers from oregano secondary metabolitescitations
- 2022Bactericidal vertically aligned graphene networks derived from renewable precursorcitations
- 2015Electrical conduction in plasma polymerized thin films of γ-terpinenecitations
- 2012Microwave properties of Yttrium Vanadate at cryogenic temperatures
- 2011The Effect of Polyterpenol Thin Film Surfaces on Bacterial Viability and Adhesioncitations
- 2008Mesurements of thin resistive films employing split post dielectric resonator technique
- 2006Temperature dependence of complex permittivity of planar microwave materialscitations
- 2005Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 Kcitations
- 2005Precise microwave characterisation of low loss dielectrics
- 2004A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuitscitations
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequenciescitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
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document
Precise microwave characterisation of low loss dielectrics
Abstract
Measurements of complex permittivity of low loss dielectric materials (especially anisotropic) in a wide range of temperatures still represent a challenging issue. For bulk samples Whispering Gallery Modes can be used, but planar dielectrics can only be measured using TEol1 and TE018 resonators. Accuracy of tanO measurements is also determined by accuracy in determination of unloaded Qo-factor of test fixtures. This paper presents a review of resonators, a precise technique to measure the Qo factor and measurement results of complex permittivity of several low loss dielectrics.