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Mazierska, Janina
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Publications (12/12 displayed)
- 2021Complex Permittivity of Mixtures of Sand With Aqueous NaCl Solutions Measured at 2.5 GHzcitations
- 2011Microwave and RF methods of contactless mapping of the sheet resistance and the complex permittivity of conductive materials and semiconductorscitations
- 2006Temperature dependence of complex permittivity of planar microwave materialscitations
- 2006Measurements of conductivity of thin gold films at microwave frequencies employing resonant techniquescitations
- 2005Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 Kcitations
- 2005Precise microwave characterisation of low loss dielectrics
- 2004A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuitscitations
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequenciescitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
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document
Precise microwave characterisation of low loss dielectrics
Abstract
Measurements of complex permittivity of low loss dielectric materials (especially anisotropic) in a wide range of temperatures still represent a challenging issue. For bulk samples Whispering Gallery Modes can be used, but planar dielectrics can only be measured using TEol1 and TE018 resonators. Accuracy of tanO measurements is also determined by accuracy in determination of unloaded Qo-factor of test fixtures. This paper presents a review of resonators, a precise technique to measure the Qo factor and measurement results of complex permittivity of several low loss dielectrics.