| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Mazierska, Janina
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2021Complex Permittivity of Mixtures of Sand With Aqueous NaCl Solutions Measured at 2.5 GHzcitations
- 2011Microwave and RF methods of contactless mapping of the sheet resistance and the complex permittivity of conductive materials and semiconductorscitations
- 2006Temperature dependence of complex permittivity of planar microwave materialscitations
- 2006Measurements of conductivity of thin gold films at microwave frequencies employing resonant techniquescitations
- 2005Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 Kcitations
- 2005Precise microwave characterisation of low loss dielectrics
- 2004A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuitscitations
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequenciescitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
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article
Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
Abstract
The permittivity and loss tangent of a dielectric material can be estimated from precise measurement data of the Q-factor and resonant frequency of a dielectric resonator containing the material under test. We have characterized an (La,Sr)(AI,Ta)O, (LSAT) single crystal of the cylindrical shape using TE011 mode dielectric resonator in two enclosures at a frequency of 15.5 GHz at temperatures from 15 K to 293 K and an LSAT planar sample at 9.7 GHz using a post cryogenic TEo1, resonator. Our measurements have shown that permittivity of LSAT is in the vicinity of23 and exhibits a peak at temperature of 190 K. We have also studied the temperature coefficient of frequency of the LSAT substrate. Due to the weaker temperature dependence of permittivity of LSAT substrates, HTS devices and circuits fabricated on LSAT can be more stable than on Lanthanum Aluminate.