Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2016High Precision Wide Range Measurement Systems with Adaptive Sensor Arrayscitations
  • 2015Analysis and improvement of post-threshold mode of adaptive cyclic ADC operation4citations

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Jędrzejewski, Konrad
2 / 6 shared
Małkiewicz, Łukasz Michał
1 / 1 shared
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2016
2015

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  • Jędrzejewski, Konrad
  • Małkiewicz, Łukasz Michał
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document

High Precision Wide Range Measurement Systems with Adaptive Sensor Arrays

  • Płatonow, Anatolij
  • Jędrzejewski, Konrad
Abstract

The paper presents a new approach to design of adaptive measurement systems (AMS) for top-precision wide range measurement of physical excitations (acceleration, pressure, etc.). AMS include the array of compensatory sensors adaptively adjusted using the analog-digital compensating circuits and digital data processing unit (DPU). The measurement of an input excitation is realized as iterative improvement of its estimates using data consequently delivered to DPU by the sensors with growing sensitivities. The principles of the system operation and optimal algorithm for the AMS control and estimation of the input excitation are described. The particularity of the AMS operation is elimination of saturation of the sensors at the confidence level provided by the proper choice of their sensitivities.

Topics
  • impedance spectroscopy
  • additive manufacturing
  • Accelerator mass spectrometry