Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
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Lloyd, Mj

  • Google
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University of Birmingham

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2024Microstructural evolution and transmutation in tungsten under ion and neutron irradiation5citations
  • 2021Radiation damage and transmutation in tungsten-alloys for nuclear fusion applicationscitations
  • 2020Radiation-induced segregation in W-Re: from kinetic Monte Carlo simulations to atom probe tomography experiments18citations
  • 2020Raman Spectroscopy of Ion Irradiated SiC: Chemical Defects, Strain, Annealing, and Oxidationcitations

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El-Atwani, Osman
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Jim, Bethany
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Haley, Jack
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Gilbert, Mr
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Co-Authors (by relevance)

  • El-Atwani, Osman
  • Jim, Bethany
  • Haley, Jack
  • Nguyen-Manh, Duc
  • Moody, Mp
  • Martinez, Enrique
  • Hattar, Khalid
  • Armstrong, Dej
  • Gilbert, Mr
  • Abernethy, Robert
  • Bagot, Paul A. J.
  • Nguyen-Manh, D.
  • Martinez, E.
  • Bagot, Paj
  • Abernethy, Rg
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document

Raman Spectroscopy of Ion Irradiated SiC: Chemical Defects, Strain, Annealing, and Oxidation

  • Lloyd, Mj
Abstract

Raman spectroscopy has been used to identify defective bonding in neon and silicon ion irradiated single crystals of 6H-SiC. Observable differences exist in the C-C bonding region corresponding to different defect structures for neon and silicon ion implantations. Raman spectra of ion irradiated SiC show less tensile strain than neutron irradiations, explained by a residual compressive stress caused by the swelling constrained by the undamaged substrate. Evidence of oxidation during high temperature ion implantation is observed as C-O and Si-O Raman signals. Annealing irradiated SiC while acquiring Raman spectra shows rapid recovery of Si-C bonding, but not a complete recovery of the unirradiated structure. Annealing irradiated SiC causes surface oxidation where unirradiated SiC does not oxidise. Comparisons are made to the apparent radiation resistance of diamond and silicon which have similar crystal structures, but are monatomic, leading to the suggestion that chemical defects are responsible for increased radiation damage in SiC.

Topics
  • impedance spectroscopy
  • surface
  • single crystal
  • laser emission spectroscopy
  • Silicon
  • defect
  • annealing
  • Raman spectroscopy
  • defect structure