Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Yakunin, A. M.

  • Google
  • 1
  • 6
  • 0

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2012Multilayer development for the generation beyond EUV: 6.x nmcitations

Places of action

Chart of shared publication
Louis, Eric
1 / 4 shared
Makhotkin, Igor Alexandrovich
1 / 1 shared
Muellender, S.
1 / 1 shared
Van De Kruijs, Robbert
1 / 22 shared
Bijkerk, Frederik
1 / 10 shared
Zoethout, E.
1 / 6 shared
Chart of publication period
2012

Co-Authors (by relevance)

  • Louis, Eric
  • Makhotkin, Igor Alexandrovich
  • Muellender, S.
  • Van De Kruijs, Robbert
  • Bijkerk, Frederik
  • Zoethout, E.
OrganizationsLocationPeople

document

Multilayer development for the generation beyond EUV: 6.x nm

  • Louis, Eric
  • Makhotkin, Igor Alexandrovich
  • Muellender, S.
  • Yakunin, A. M.
  • Van De Kruijs, Robbert
  • Bijkerk, Frederik
  • Zoethout, E.
Abstract

Radiation of 6.x nm wavelength is a possible candidate for the next generation of optical lithography aiming at sub 8 nm resolution in single exposure. Construction of multilayer optics based on La and B remains a challenge due to a stronger requirement for layer thickness and interface roughness. The main challenge is to prevent intermixing of the multilayer materials, particularly since individual layer thicknesses (~1.5 nm) are in the same range as the naturally formed compounded interfaces. In recent research we have shown that the formation of La-nitride by N-ion treatment of the La layers reduces compound formation, providing a better optical contrast, thus leading to an increase of the multilayer mirror reflectivity. We also argue that LaN is optically preferred over pure La. Mirrors for 6.x nm require more than 150 periods for a maximum theoretical peak reflectance of 78% for an ideal structure. To deposit such an amount of periods the deposition technique is being optimized. A first optimization of the deposition process has enabled full stack (150 periods) LaN/B4C multilayer mirror samples yielding 47.2% reflectivity at l=6.63 nm (Fig. 1) at near normal incidence. Further optimization of the deposition and nitridation technique is planned aiming to further reduce interface compound formation and roughness value. First of all the magnetron plasma should be optimized in order maximize plasma ion polishing effects and minimize layers intermixture induced by high energy ions and neutrals. Further interface roughness reduction can be achieved by tuning the energy of the atoms being deposited and by low energy ion treatment of the deposited layers

Topics
  • Deposition
  • impedance spectroscopy
  • compound
  • nitride
  • lithography
  • polishing