Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Serdijn, Wouter A.

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Delft University of Technology

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2022Multilayer CVD graphene electrodes using a transfer-free process for the next generation of optically transparent and MRI-compatible neural interfaces22citations
  • 2022Multilayer CVD graphene electrodes using a transfer-free process for the next generation of optically transparent and MRI-compatible neural interfaces22citations
  • 2020Long-term encapsulation of platinum metallization using a HfO2 ALD - PDMS bilayer for non-hermetic active implants18citations
  • 2019Effect of Signals on the Encapsulation Performance of Parylene Coated Platinum Tracks for Active Medical Implants15citations
  • 2019The influence of soft encapsulation materials on the wireless power transfer links efficiencycitations
  • 2019Energy efficient sampling and conversion of bio-signals using time-mode circuitscitations
  • 2019Towards an Active Graphene-PDMS Implantcitations
  • 2018MEMS-Electronics Integration 2: A Smart Temperature Sensor for an Organ-on-a-chip Platformcitations

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Bakhshaee Babaroud, Nasim
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Weingärtner, Sebastian
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Palmar, Merlin
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Velea, Andrada Iulia
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Giagka, Vasiliki
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Vos, Frans M.
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Vollebregt, Sten
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Bourgeois, Florian
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Malissovas, Anastasios
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Co-Authors (by relevance)

  • Bakhshaee Babaroud, Nasim
  • Weingärtner, Sebastian
  • Palmar, Merlin
  • Velea, Andrada Iulia
  • Giagka, Vasiliki
  • Vos, Frans M.
  • Vollebregt, Sten
  • Coletti, Chiara
  • Babaroud, Nasim Bakhshaee
  • Vos, Frans
  • Velea, Andrada Lulia
  • Ritasalo, Riina
  • Nanbakhsh, Kambiz
  • Bourgeois, Florian
  • Dekker, Ronald
  • Kluba, Marta
  • Pahl, Barbara
  • Malissovas, Anastasios
  • Akgun, Omer Can
  • Wardhana, Gandhika K.
  • Ponte, Ronaldo
OrganizationsLocationPeople

document

MEMS-Electronics Integration 2: A Smart Temperature Sensor for an Organ-on-a-chip Platform

  • Giagka, Vasiliki
  • Ponte, Ronaldo
  • Serdijn, Wouter A.
Abstract

In this work, an in-situ smart temperature sensor is designed and monolithically integrated in an organon-a-chip (OOC) platform. This will allow a non-incubator temperature monitoring, besides a more accurate temperature measurement of the cell culture. The custom, simple, robust and flexible IC technology used for the sensor fabrication grants a very cost-effective integrated solution in virtue of the reduced cost per wafer along with the large silicon area available in the platform. The circuit comprises a PTAT generator that periodically feeds a current controlled oscillator to produce a digitally-represented signal. The temperature information depends on this feeding periodicity, therefore, it is encoded in the time domain. The periodic switching activity is controlled by the output of the comparator and the first buffer stage. The output can be interfaced with a microcontroller for further post-processing. The fabrication used a “MEMS-last” process to avoid potential PDMS and other material contamination. A planar BiCMOS IC technology that requires only 7 masks steps is used to fabricate NPN and n/p-MOSFET transistors. A double-polished p-type silicon wafer was used. Mask 1 defines the n-well and the collector area of the NPN transistor, while masks 2 and 3 define, respectively, the n/p-type diffusion areas for the CMOS and the emitter/base area for the bipolar device. Contact openings are wet etched after the patterning of mask 4, while mask 5 is used to pattern the interconnect and gate material via deposition of AlSi. Masks 6 and 7 are used to open vias and deposit the second metallization. This last step is also used to deposit the first metallization of the OOC. The process follows with the SiO2 deposition using PECVD on the front and back of the wafer. The SiO2 layer on the back is dry etched to define the membrane area. PDMS is spun onto the front of the wafer and cured for 30 min at 90 °C. Finally, the membrane is released removing the Si and the SiO2 layers from underneath the membrane using DRIE and BHF, respectively. Wafer level measurements confirms the functionality of the circuit.

Topics
  • Deposition
  • impedance spectroscopy
  • Silicon
  • ion chromatography