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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Teyssedre, Gilbert
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2023Measurement setup to simultaneously explore the location and energy of trapped charges in thin polymer filmscitations
- 2020Dielectric Properties and beta-Relaxation in Cross- linked Polyethylene: Effect of Thermal Agingcitations
- 2020Behavior of space charge in polyimide and the influence on power semiconductor device reliability
- 2018Nonlinear Regression Modeling to Predict Thermal Endurance of XLPE Material under Thermal Agingcitations
- 2018Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocompositescitations
- 2018Analysis of Charge Accumulation Phenomena by Physicochemical Analysis for fluorinated Polymer Films Irradiated by Proton
- 2018Characterization of the electrical behaviour of thin dielectric films at nanoscale using technics methods derived from Atomic Force Microscopy : application to plasma deposited AgNPs-based nanocomposites
- 2016Space charge measurements on electron-beam irradiated LDPE films, with and without metallization of irradiated surface
- 2016The significance of electroluminescence in polyolefins
- 2014Efficient barrier for charge injection in polyethylene by silver nanoparticles/plasma polymer stackcitations
- 2014Implementation of polarization processes in a charge transport model using time and frequency domain measurements on PEN films
- 2014Tuning the plasma parameters for deposition of thin nanocomposite layer containing a monolayer of silver nanoparticles on polymer film
- 2007The grafting of luminescent side groups onto poly(vinyl chloride) and the identification of local structural features
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booksection
Behavior of space charge in polyimide and the influence on power semiconductor device reliability
Abstract
Polyimide is widely used in film form as a passivation material for power semiconductor devices such as Si, SiC, GaN, etc. The magnitude of the electric field at the edge termination area of these semiconductor devices is becoming higher due to the increase of operational voltage and/or demand for shrinking the edge termination area to increase device active area. Hence it is concerned that the accumulation of space charge in the encapsulation and passivation material may affect the insulation performance of these devices, for example, the degradation of withstand voltage due to distortion of the internal electric field caused by space charge accumulation. To design space charge resistance of semiconductor devices, it is important to understand the space charge behavior in polyimide films with a thickness of several to several tens of µm. This chapter addresses practical implementation, specifications and issues on space charge in polyimide insulation on power semiconductor devices focusing on the space charge measurements in thin polyimide films using the latest developed LIMM method and DC conductivity measurements.