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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Vereecken, Jean
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (7/7 displayed)
- 2017Development of an Electrochemical Procedure for Monitoring Hydrogen Sorption/Desorption in Steelcitations
- 2008The interaction of human serum albumin with titanium studied by means of atomic force microscopy
- 2007Quantitative determination of the composition of nitrided layers on iron using AES
- 2007Influence of laser surface hardening on the corrosion resistance of martensitic stainless steel
- 2006Discrimination between gamma’-Fe4N and epsilon Fe2-3N iron nitride compounds using PCA of Auger electron spectra.
- 2004AES analysis of nitride layers on steel with target factor analysis
- 2004Electrochemical impedance spectroscopy in the presence of non-linear distortions and non-stationary behaviour Part I: theory and validation
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article
AES analysis of nitride layers on steel with target factor analysis
Abstract
Industrially nitrided steel samples are analysed with AES. The aim of this work is to optimize the quantification of nitrogen and to extract the chemical information hidden in the shape of the measured Auger peaks with Target Factor Analysis (TFA).<br/><br/>To optimize the use of TFA, reference samples of pure components are necessary. These components are made in a laboratory reactor in which pure iron is nitrided. The resulting nitride layer is identified with X-Ray Diffraction (XRD). Afterwards their AES spectra are taken as input for the TFA of the industrial layers. In this paper, the preparation and the characterization of a γ′-Fe4N standard is discussed, as well as the correction of the sensitivity factors used for the quantification of nitrogen. Finally, the application of TFA on an industrial nitride layer is discussed