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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Hansen, F. Y.
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Publications (5/5 displayed)
- 2009Structure and phase transitions of monolayers of intermediate-length n-alkanes on graphite studied by neutron diffraction and molecular dynamics simulationcitations
- 2004Slow Diffusive Motions in a Monolayer of Tetracosane Molecules Adsorbed on Graphitecitations
- 2002"Slow" Diffusive Motions in Tetracosane Monolayers Adsorbed on Graphite
- 2001Monolayer Structure of the n-Alkane Tetracosane
- 2001X-ray Specular Reflectivity Study of an n-Alkane Film, Dotriacontane, Adsorbed on Si(100) Substrates
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document
X-ray Specular Reflectivity Study of an n-Alkane Film, Dotriacontane, Adsorbed on Si(100) Substrates
Abstract
Synchrotron x-ray specular reflectivity measurements have been used to investigate the structure and growth mode of dotriacontane (n-C_32H_66 or C32) films adsorbed from a heptane (n-C_7H_16) solution onto SiO_2-coated Si(100) substrates. The C32 films serve as prototypes for structural studies of more complex polymer films at solid interfaces. They are also of technological interest, since intermediate-length alkanes are the principal constituents of commercial lubricants. The reflectivity curves are fit to a three-slab model consisting of a semi-infinite Si substrate, an SiO<SUB>2</SUB> slab, and a slab of C32. In general, the inferred C32 slab thickness is in reasonable agreement with high-resolution ellipsometry measurements on the same sample similarly heat treated.(U. G. Volkmann, M. Pino, and H. Taub, Bull. Am. Phys. Soc. 45), 996 (2000); and to be published. Our x-ray reflectivity curves indicate that it is possible to grow thicker C32 films than previously observed(C. Merkl, T. Pfohl, and H.Riegler, Phys. Rev. Lett. 79), 4625 (1997). but that the thickness and roughness of the films depend sensitively on their heat treatment. <P />...