People | Locations | Statistics |
---|---|---|
Naji, M. |
| |
Motta, Antonella |
| |
Aletan, Dirar |
| |
Mohamed, Tarek |
| |
Ertürk, Emre |
| |
Taccardi, Nicola |
| |
Kononenko, Denys |
| |
Petrov, R. H. | Madrid |
|
Alshaaer, Mazen | Brussels |
|
Bih, L. |
| |
Casati, R. |
| |
Muller, Hermance |
| |
Kočí, Jan | Prague |
|
Šuljagić, Marija |
| |
Kalteremidou, Kalliopi-Artemi | Brussels |
|
Azam, Siraj |
| |
Ospanova, Alyiya |
| |
Blanpain, Bart |
| |
Ali, M. A. |
| |
Popa, V. |
| |
Rančić, M. |
| |
Ollier, Nadège |
| |
Azevedo, Nuno Monteiro |
| |
Landes, Michael |
| |
Rignanese, Gian-Marco |
|
Kampwerth, Henner
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2013Improved Silver Optical Constants for Photovoltaic Plasmonics
- 2012The Effect of Rear Surface Passivation Layer Thickness on High Efficiency Solar Cells with Planar and Scattering Metal Reflectors ; Proceedings of the 38th IEEE Photovoltaic Specialists Conferencecitations
- 2011Scattering Back Reflector Designs for High Efficiency Silicon Solar Cells
- 2004Laser-fired contact silicon solar cells on p- and n-substrates
Places of action
Organizations | Location | People |
---|
conferencepaper
Laser-fired contact silicon solar cells on p- and n-substrates
Abstract
S.408-411 ; A fabrication process is described that is simple, uses conventional equipment and yet is capable of producing highefficiency crystalline silicon solar cells. It is based on a deep phosphorus diffusion to form the front emitter region and a deep aluminum diffusion to form a back BSF region. The total charge of phosphorus atoms is controlled to the desired level in a conventional open-tube POCl, furnace by adjusting the mix of gases that flow into it, the time and the temperature. A thin SiO, layer is grown in the same diffusion tube to passivate the surface. After aluminum deposition on the back side, the wafers go directly to a second furnace where both dopants are drove in for a relatively long time and at a high temperature. One of the nicest things of this process is that it minimizes wet etching and cleaning steps. The resulting devices have a relatively thick, moderately-doped and surface-passivated emitter well suited for low cost metallization techniques.