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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Shen, G.
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document
A Paris-Edinburgh cell for studying silicate melts at high pressures
Abstract
We have set up a Paris-Edinburgh Press (PEP) combined with a multi-channel collimator (MCC) assembly at the GSECARS beamline of the Advanced Photon Source for monochromatic X-ray diffraction. ThePEP is mounted on a general-purpose diffractometer, with a single-photon counting area detector (Pilatus3 X 300K-W) mounted on the two-theta arm. The incident Si(111) or Si(311) monochromatic beam is focused both horizontally and vertically with large Kirkpatrick-Baez mirrors. With this setup, background scatter from the surrounding pressure media is completely removed at 2qangles above 10° for samples larger than 0.5 mm in diameter by oscillating the MCC during data collection.About 10 min. is sufficient to collect signals of a 2 mm diameter borosilicate glass sample (a weak scatterer), with minimal background scatter.The system is modularized into a few permanent units, allowing fast installation in station 13-ID-C. In order to extract the "real" X-ray diffraction signal from amorphous samples, proper corrections are necessary. The critical ones to be considered include background from the surrounding high pressure cell assembly, multiple scattering inside the hutch, dark field of the detector, and the "shadow" effect of the MCC. Procedures for establishing proper transfer function have been established. Atomic bond lengths acquired from sodium disilicate glass structure data at ambient conditions agree well with previous studies based on neutron scattering (Misawa et al., 1980) and theoretical calculation (Smith et al., 1995), demonstrating the reliability of our setup. Structure data of sodium disilicate melts has been collected up to 3 GPa and 1600 °C. The derived structure factors and atomic pair distribution functions will help us understand howbond lengths (Si-O, Na-O, O-O, Si-Si) and bond angles (Si-O-Si) respond to pressure and temperature and their possible roles in affecting transport properties in silicate melts. <P />...