Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Tran, Tuan

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Uppsala University

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2024Magnetic metamaterials by ion-implantation2citations
  • 2024Ion-beam assisted synthesis and thermal oxidation of TiN thin films combined with in-situ, depth-resolved characterization using MeV ions3citations
  • 2023High hole mobility and non-localized states in amorphous germanium2citations
  • 2021Growth of two-dimensional WS2 thin films by reactive sputtering21citations
  • 2019Non-localized states and high hole mobility in amorphous germaniumcitations
  • 2015Temperature-dependent mechanical deformation of silicon at the nanoscale: Phase transformation versus defect propagation32citations

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Kapaklis, Vassilios
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Vantaraki, Christina
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Ström, Petter
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Foerster, Michael
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Grassi, Matías Pablo
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Sadowski, Jerzy T.
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Primetzhofer, Daniel
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Fevola, Giovanni
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Nagy, Gyula
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Williams, Jim S.
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Smillie, Lachlan A.
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Grimaldi, Maria G.
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Villamayor, Michelle, Marie S.
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Sorgenfrei, Nomi L. A. N.
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Johansson, Fredrik, O. L.
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Föhlisch, Alexander
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Lindblad, Andreas
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Lourenço, Pedro
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Bernard, Romain
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Nyberg, Tomas
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Haberl, B.
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Smillie, L. A.
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Bradby, J. E.
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Subianto, D.
1 / 1 shared
Williams, J. S.
1 / 39 shared
Kiran, M. S. R. N.
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Co-Authors (by relevance)

  • Kapaklis, Vassilios
  • Vantaraki, Christina
  • Ström, Petter
  • Foerster, Michael
  • Grassi, Matías Pablo
  • Sadowski, Jerzy T.
  • Primetzhofer, Daniel
  • Fevola, Giovanni
  • Nagy, Gyula
  • Williams, Jim S.
  • Wong-Leung, Jennifer
  • Smillie, Lachlan A.
  • Hallen, Anders
  • Grimaldi, Maria G.
  • Giangrisotomi, Erika
  • Prévot, Geoffroy
  • Pham, Ngan, Hoang
  • Witkowski, Nadine
  • Villamayor, Michelle, Marie S.
  • Sorgenfrei, Nomi L. A. N.
  • Johansson, Fredrik, O. L.
  • Föhlisch, Alexander
  • Lindblad, Andreas
  • Lourenço, Pedro
  • Bernard, Romain
  • Nyberg, Tomas
  • Haberl, B.
  • Smillie, L. A.
  • Bradby, J. E.
  • Subianto, D.
  • Williams, J. S.
  • Kiran, M. S. R. N.
OrganizationsLocationPeople

document

Non-localized states and high hole mobility in amorphous germanium

  • Tran, Tuan
Abstract

Covalent amorphous semiconductors, such as amorphous silicon (a-Si) and germanium (a-Ge), are commonly believed to have localized electronic states at the top of the valence band and the bottom of the conduction band. Electrical conductivity is thought to be by the hopping mechanism through localized states. The carrier mobility of these materials is usually very low, in the order of ~10^-3 - 10^-2 cm^2/(Vs) at room temperature. In this study, we present the Hall effect characterization of a-Ge prepared by self-ion implantation of Ge ions. The a-Ge prepared by this method is highly homogenous and has a mass density within 98.5% of the crystalline Ge. The material exhibits an exceptionally high electrical conductivity and carrier mobility (~100 cm^2/(Vs)) for an amorphous semiconductor. The temperature-dependent resistivity of the material is very-well defined with two distinctive regions, extrinsic and intrinsic conductivity, as in crystalline Ge. These results are direct evidence for a largely-preserved band structure and non-localized states of the valence band in a-Ge, as proposed by Tauc et al. from optical characterization alone. This finding is not only significant for the understanding of electrical conductivity in covalent disordered semiconductors, but the exceptionally high mobility we have observed in amorphous Ge opens up device applications not previously considered for amorphous semiconductors.

Topics
  • density
  • impedance spectroscopy
  • amorphous
  • resistivity
  • mobility
  • semiconductor
  • Silicon
  • electrical conductivity
  • band structure
  • Germanium