Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2010Mecanism de creştere şi proprietǎţi ale filmelor subţiri de YBa2Cu3O7-αdepuse prin ablaţie laser PE (001) SrTiO3citations

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Andronescu, Ecaterina
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Neagu, Dragos
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Ştefan, Elena
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2010

Co-Authors (by relevance)

  • Andronescu, Ecaterina
  • Neagu, Dragos
  • Ştefan, Elena
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article

Mecanism de creştere şi proprietǎţi ale filmelor subţiri de YBa2Cu3O7-αdepuse prin ablaţie laser PE (001) SrTiO3

  • Leca, Victor
  • Andronescu, Ecaterina
  • Neagu, Dragos
  • Ştefan, Elena
Abstract

<p>High quality, single phase c-axis oriented YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-α</sub> thin films with superconducting properties were grown by laser ablation on (001) SrTiO<sub>3</sub> substrates. The surface morphology of the films has been investigated by means of high-pressure reflection high energy electron diffraction (RHEED), atomic force microscopy (AFM), and scanning electron microscopy (SEM), while the structural properties were studied by X-ray diffraction (XRD). Deposition under optimum conditions produces films with relatively smooth surface, with a roughness of about 10-15 nm, as confirmed by AFM and SEM data. The growth follows a Stransky-Krastanov mechanism governed by the substrate-film interface properties due to presence of epitaxial strain. The films show good superconducting properties with T<sub>c</sub> values of 85-91 K. Results on the fabrication and electrical transport properties of ramp-type Josephson junctions with YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-α</sub> electrodes and PrBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-α</sub> barrier are presented.</p>

Topics
  • Deposition
  • surface
  • phase
  • scanning electron microscopy
  • x-ray diffraction
  • thin film
  • atomic force microscopy
  • laser ablation
  • high energy electron diffraction