Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Xiao, A.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (12/12 displayed)

  • 2011Temperature moisture and mode mixity dependent EMC-Copper (oxide) interfacial toughnesscitations
  • 2010Delamination and combined compound cracking of EMC-copper interfacescitations
  • 2010Temperature moisture and mode mixity dependent EMC- Copper (Oxide) interfacial toughnesscitations
  • 2010Procedure to determine interfacial toughness of EMC-copper (oxide) interfacescitations
  • 2009How to fabricate specimens for silicon-to-molding compound interface adhesion measurements8citations
  • 2009Establishing mixed mode fracture properties of EMC-copper (-oxide) interfaces at various temperatures13citations
  • 2009Establishing mixed mode fracture properties of EMC-copper (-oxide) interfaces at various temperatures13citations
  • 2009Establishing fracture properties of EMC-copper interfaces in the Visco-Elastic temperature region13citations
  • 2008Mixed mode interface characterization considering thermal residual stress8citations
  • 2008Interfacial Fracture Properties and Failure Modeling for Microelectronics19citations
  • 2008Interface characterization and failure modeling for Semiconductor packages15citations
  • 2008Advanced Viscoelastic Material Model for Predicting Warpage of a QFN Panelcitations

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Chart of shared publication
Jansen, K. M. B.
6 / 19 shared
Schlottig, G.
8 / 12 shared
Pape, H.
11 / 13 shared
Ernst, L. J.
6 / 15 shared
Wunderle, B.
10 / 32 shared
Jansen, Kaspar
4 / 48 shared
Ernst, Lj
4 / 26 shared
Wunderle, W.
1 / 1 shared
Leung, Yy
1 / 1 shared
Ernst, L.
1 / 1 shared
Ernst, Lj Leo
1 / 2 shared
Jansen, Kmb
1 / 2 shared
Sluis, O. Van Der
1 / 9 shared
Sluis, Van Der, O.
1 / 16 shared
Vreugd, J. De
3 / 12 shared
Kessler, A.
1 / 5 shared
Bohm, C.
1 / 10 shared
Stecher, M.
1 / 4 shared
Preu, H.
1 / 6 shared
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Co-Authors (by relevance)

  • Jansen, K. M. B.
  • Schlottig, G.
  • Pape, H.
  • Ernst, L. J.
  • Wunderle, B.
  • Jansen, Kaspar
  • Ernst, Lj
  • Wunderle, W.
  • Leung, Yy
  • Ernst, L.
  • Ernst, Lj Leo
  • Jansen, Kmb
  • Sluis, O. Van Der
  • Sluis, Van Der, O.
  • Vreugd, J. De
  • Kessler, A.
  • Bohm, C.
  • Stecher, M.
  • Preu, H.
OrganizationsLocationPeople

document

Advanced Viscoelastic Material Model for Predicting Warpage of a QFN Panel

  • Vreugd, J. De
  • Kessler, A.
  • Bohm, C.
  • Stecher, M.
  • Xiao, A.
  • Preu, H.
  • Jansen, Kaspar
  • Ernst, Lj
Abstract

Warpage is a critical issue for a QFN panel molding process. Much work was done in the past to predict the warpage of a package during cooling down from molding temperature. However, until now, warpage could not always be predicted well, even if the viscoelastic behavior of the molding compound is taken into account. It was for example observed that the cooling velocity affected the warpage after cooling down. Because of this reason, the mechanical behavior of the molding compound was investigated in more detail. In this research, the mechanical properties of the molding compound are determined. It turned out that the properties are highly dependent on time and temperature. A complete viscoelastic model of the model compound is achieved by combining DMA and dilatometric test results. The model is implemented in the finite element software ABAQUS. In this study, our advanced model is compared with elastic calculations which are normally done. A validation experiment is performed in which simulation results are compared with experimental warpage data of a double layered beam, consisting of a layer of molding compound and a layer of silicon. This beam is cooled down from a temperature above Tg to room temperature with different cooling rates. In the meantime warpage is measured and compared to simulation results. Finally, the advanced material model is used for calculations on a QFN-panel.

Topics
  • impedance spectroscopy
  • compound
  • experiment
  • simulation
  • layered
  • thermogravimetry
  • Silicon