Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2010High temperature storage influence on molding compound propertiescitations
  • 2010Prediction of cure induced warpage of micro-electronic productscitations
  • 2010Thermal aging of molding compoundscitations
  • 2009Modeling and characterization of molding compound properties during curecitations
  • 2009Cure induced Warpage of micro-electronics: comparison with experimentscitations
  • 2009Moisture absorption and hygroscopic swelling characterization of molding compoundcitations
  • 2009Effect of Postcure and Thermal Aging on Molding Compound Propertiescitations
  • 2008A Characterization Method for Viscoelastic Bulk Modulus of Molding Compoundscitations
  • 2008Advanced Viscoelastic Material Model for Predicting Warpage of a QFN Panelcitations
  • 2008Characterization and modeling of molding compound properties during curecitations

Places of action

Chart of shared publication
Pufall, R.
1 / 7 shared
Vreugd, J. De
7 / 12 shared
Jansen, Kaspar
10 / 48 shared
Ernst, Lj
10 / 26 shared
Kessler, A.
5 / 5 shared
Stecher, M.
4 / 4 shared
Preu, H.
5 / 6 shared
Qian, C.
2 / 7 shared
Falat, Tc
1 / 2 shared
Monforte, A. Sanchez
1 / 1 shared
Patel, Md
1 / 1 shared
Saraswat, Mk
1 / 1 shared
Xiao, A.
1 / 12 shared
Chart of publication period
2010
2009
2008

Co-Authors (by relevance)

  • Pufall, R.
  • Vreugd, J. De
  • Jansen, Kaspar
  • Ernst, Lj
  • Kessler, A.
  • Stecher, M.
  • Preu, H.
  • Qian, C.
  • Falat, Tc
  • Monforte, A. Sanchez
  • Patel, Md
  • Saraswat, Mk
  • Xiao, A.
OrganizationsLocationPeople

document

Advanced Viscoelastic Material Model for Predicting Warpage of a QFN Panel

  • Vreugd, J. De
  • Kessler, A.
  • Bohm, C.
  • Stecher, M.
  • Xiao, A.
  • Preu, H.
  • Jansen, Kaspar
  • Ernst, Lj
Abstract

Warpage is a critical issue for a QFN panel molding process. Much work was done in the past to predict the warpage of a package during cooling down from molding temperature. However, until now, warpage could not always be predicted well, even if the viscoelastic behavior of the molding compound is taken into account. It was for example observed that the cooling velocity affected the warpage after cooling down. Because of this reason, the mechanical behavior of the molding compound was investigated in more detail. In this research, the mechanical properties of the molding compound are determined. It turned out that the properties are highly dependent on time and temperature. A complete viscoelastic model of the model compound is achieved by combining DMA and dilatometric test results. The model is implemented in the finite element software ABAQUS. In this study, our advanced model is compared with elastic calculations which are normally done. A validation experiment is performed in which simulation results are compared with experimental warpage data of a double layered beam, consisting of a layer of molding compound and a layer of silicon. This beam is cooled down from a temperature above Tg to room temperature with different cooling rates. In the meantime warpage is measured and compared to simulation results. Finally, the advanced material model is used for calculations on a QFN-panel.

Topics
  • impedance spectroscopy
  • compound
  • experiment
  • simulation
  • layered
  • thermogravimetry
  • Silicon