Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Raniero, L.

  • Google
  • 3
  • 13
  • 3

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2011Temperature influence on the thermal and structural properties of electrodeposited nanostructured black nickel cermet on high conductive C81100 copper3citations
  • 2006The study of high temperature annealing of a-SiC:H filmscitations
  • 2004Batch processing method to deposit a-Sicitations

Places of action

Chart of shared publication
Oliveira, Ac
1 / 1 shared
Coelho, B.
1 / 1 shared
Simao, Ra
1 / 1 shared
Teixeira, Rlp
1 / 1 shared
Vilarinho, P.
1 / 6 shared
Perreira, L.
1 / 1 shared
Ferreira, Isabel
2 / 45 shared
Hu, Z.
1 / 4 shared
Martins, Rodrigo
2 / 166 shared
Zhang, S.
1 / 64 shared
Liao, X.
1 / 8 shared
Pereira, Luis
1 / 54 shared
Águas, Hugo
1 / 41 shared
Chart of publication period
2011
2006
2004

Co-Authors (by relevance)

  • Oliveira, Ac
  • Coelho, B.
  • Simao, Ra
  • Teixeira, Rlp
  • Vilarinho, P.
  • Perreira, L.
  • Ferreira, Isabel
  • Hu, Z.
  • Martins, Rodrigo
  • Zhang, S.
  • Liao, X.
  • Pereira, Luis
  • Águas, Hugo
OrganizationsLocationPeople

article

Batch processing method to deposit a-Si

  • Pereira, Luis
  • Águas, Hugo
  • Ferreira, Isabel
  • Martins, Rodrigo
  • Raniero, L.
Abstract

<p>This work reports a technique to obtain electronic grade intrinsic amorphous silicon using the plasma enhanced chemical vapour deposition technique at 13.56 MHz. The batch processing method consists of igniting the plasma process through a neutral gas such as hydrogen or helium and only feeding the carrier gas containing the species to be decomposed into the reactor when the plasma is stabilized. By doing so, no surface damage is induced in the first deposited layers and so a more compacted and stable film is produced, compared to amorphous films grown by conventional methods. The best deposition conditions to produce films with good transport properties for optoelectronic applications are: temperature ≈ 473 K, 60 &lt;pressure 87 Pa, power density of 32 mW/cm<sup>2</sup> and flow of silane ≈ 10 sccm. The growth rate and the microstructure factor are 1.5 Å/s and 3.3×10<sup>-2</sup>, respectively, while the activation energy ≈ 0.8 eV; dark conductivity at room temperature ≈ 4.37×10<sup>-10</sup> (ωcm)<sup>-1</sup>; photosensiti-vity ≈ 5.02×l0<sup>6</sup>; density of states ≈ 6.6×10<sup>15</sup> cm<sup>-3</sup>; bonded hydrogen concentration ≈ 20 at% and optical band gap ≈ 1.75 eV.</p>

Topics
  • Deposition
  • density
  • impedance spectroscopy
  • microstructure
  • surface
  • amorphous
  • Hydrogen
  • Silicon
  • activation