| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Horsewell, Andy
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Topics
Publications (14/14 displayed)
- 2014A TEM Study on the Ti-Alloyed Grey Iron
- 2012Mechanical properties of low-density polyethylene filled by graphite nanoplateletscitations
- 2012A TEM Study on the Microstructure of Fine Flaky Graphite
- 2011Advanced 2D and 3D Electron Microscopy Analysis of Clay/PP Nanocomposites
- 20093-D Analysis of Graphite Nodules in Ductile Cast Iron Using FIB-SEM
- 2009Development of Focused Ion Beam technique for high speed steel 3D-SEM artefact fabrication
- 2008Changes in the tribological behavior of an epoxy resin by incorporating CuO nanoparticles and PTFE microparticlescitations
- 2008Ge nanoclusters in PECVD-deposited glass caused only by heat treatmentcitations
- 2007Grey-scale conversion X-ray mapping by EDS of multielement and multiphase layered microstructurescitations
- 2007Learning about materials science and technology by deconstructing modern products
- 2007Ge nanoclusters in PECVD-deposited glass after heat treating and electron irradiationcitations
- 2005Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique
- 2005Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique
- 2001Crack Growth along Interfaces in Porous Ceramic Layerscitations
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document
3-D Analysis of Graphite Nodules in Ductile Cast Iron Using FIB-SEM
Abstract
Ductile cast iron samples were analysed in a Focused Ion Beam Scanning Electron Microscope, FIB-SEM. The focussed ion beam was used to carefully remove layers of the graphite nodules to reveal internal structures in the nodules.The sample preparation and milling procedure for sectioning graphite nodules is described and ef-fects of preparation methods discussed.It was found that nodules contain different types of inclusions. These were analysed for chemical composition and crystallography using energy dispersive spectrometry (EDS) and electron back-scatter patterns (EBSP). Location of inclusions inside the nodules, their orientation in relation to the graphite and the chemistry of the inclusions is analysed and described. Formation of the structures during solidification and subsequent cooling to room temperature is discussed.