Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2020Hybrid process chain for the integration of direct ink writing and polymer injection molding13citations
  • 2019Comparison of Selective Laser Melting Post-Processes based on Amplitude and Functional Surface Roughness parameterscitations
  • 2019Modelling the filling behavior of micro structured plastic optical componentscitations
  • 2018Manufacturing Signatures of Injection Molding and Injection Compression Molding for Micro-Structured Polymer Fresnel Lens Production30citations
  • 2018Pitch measurements validation of a structural coloured steel insert using Scanning Confocal Microscopy (SCM) and Atomic Force Microscopy (AFM)citations
  • 2018Evaluation of injection pressure as a process fingerprint for Injection and Injection Compression Molding of micro structured optical componentscitations
  • 2018Zero Defects manufacturing in Injection Compression Molding of Polymer Fresnel Lensescitations

Places of action

Chart of shared publication
Tosello, Guido
7 / 101 shared
Piccolo, Leonardo
1 / 1 shared
Shemelya, Corey
1 / 1 shared
Masato, Davide
1 / 6 shared
Brown, Eric
1 / 7 shared
Haahrlillevang, Lasse
1 / 1 shared
Vedel-Smith, Nikolaj Kjelgaard
1 / 9 shared
Kain, Martin
1 / 7 shared
Calaon, Matteo
5 / 41 shared
Quagliotti, Danilo
3 / 10 shared
Parenti, Paolo
2 / 11 shared
Annoni, Massimiliano
2 / 11 shared
Garnæs, Jørgen
1 / 6 shared
Yang, Yang
1 / 26 shared
Guochin, Ping
1 / 1 shared
Zhang, Yang
1 / 38 shared
Parenti, P.
1 / 5 shared
Annoni, M.
1 / 4 shared
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2020
2019
2018

Co-Authors (by relevance)

  • Tosello, Guido
  • Piccolo, Leonardo
  • Shemelya, Corey
  • Masato, Davide
  • Brown, Eric
  • Haahrlillevang, Lasse
  • Vedel-Smith, Nikolaj Kjelgaard
  • Kain, Martin
  • Calaon, Matteo
  • Quagliotti, Danilo
  • Parenti, Paolo
  • Annoni, Massimiliano
  • Garnæs, Jørgen
  • Yang, Yang
  • Guochin, Ping
  • Zhang, Yang
  • Parenti, P.
  • Annoni, M.
OrganizationsLocationPeople

conferencepaper

Pitch measurements validation of a structural coloured steel insert using Scanning Confocal Microscopy (SCM) and Atomic Force Microscopy (AFM)

  • Garnæs, Jørgen
  • Calaon, Matteo
  • Yang, Yang
  • Tosello, Guido
  • Guochin, Ping
  • Zhang, Yang
  • Loaldi, Dario
Abstract

The optical principle of structural colouration provides to a surface unnatural and iridescent colouring properties. Surface topographycombined with lighting characteristics are the physical driver of the phenomenon. Structural colouring arises from the presence on the specimen of nanoscale features distanced by a length comparable to the near visible light spectrum (300‐1000 nm). The microstructures behave as a bandpass filter for certain light wavelengths, enabling an unnatural colouring effect. Elliptical Vibration Texturing (EVT) is an on development technology for fast texturing of gratings on metal inserts for structural colouration purposes.To identify the accuracy of EVT, in this study, two different microscopes assess an EVT grating with a 1000 nm nominal pitch on asteel flat surface. On first, optical‐based metrology is selected adopting a Laser Scanning Confocal Microscope (SCM) with a 405 nm blue source to tackle the measuring purpose. Secondly, an Atomic Force Microscope (AFM) in Intermittent contact mode (IC‐AFM) isadopted. Considering the differences in set‐up time and scanning range, the objective of this research is to identify the mostfavourable measuring technique.On the sample images, five average profiles on different locations provide consistent information about the process repeatability.Pitch estimation comes by means of FFT algorithm on the extracted profiles. The average result for SCM measures is 1002 ± 31 nmwhile for AFM is 972 ± 15 nm. At last, from these results, the estimation of EVT accuracy is presented.

Topics
  • impedance spectroscopy
  • microstructure
  • surface
  • atomic force microscopy
  • steel
  • confocal microscopy
  • ion chromatography