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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Muhamedsalih, Hussam
University of Huddersfield
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2019Fabrication and characterisation of metal-doped pectin filmscitations
- 2015Implementation of wavelength scanning interferometry for R2R flexible PV barrier films
- 2014Development of the basis for in process metrology for roll to roll production of flexible photo voltaics
- 2014An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry
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document
An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry
Abstract
<p>The quality and lifetime of flexible photovoltaic (PV) modules is dependent on having an effective vapour barrier layer which protects active elements from environmental degradation. An effective flexible barrier layer can be produced by employing a thin film of Al<sub>2</sub>O<sub>3</sub> (40-100 nm thick) on a polymer substrate using atomic layer deposition (ALD). By measuring the surface of the barrier coating critical defects that will result in excess vapour transmission can be detected and minimised. Such, knowledge of defect size, type and distribution forms a crucial dataset for informing process control. This paper reports on a practical embedded inspection technique to measure the surface topography of the thin ALD deposited Al<sub>2</sub>O<sub>3</sub> barrier film on a roll-to-roll manufacturing platform. The method combines wavelength scanning interferometry (WSI) along with an auto-focus method. Example measurements are given and discussed.</p>