| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Gao, Feng
University of Huddersfield
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (39/39 displayed)
- 2024How Photogenerated I 2 Induces I-Rich Phase Formation in Lead Mixed Halide Perovskitescitations
- 2024Harmonizing organic photovoltaics research and development among academia and industrycitations
- 2024How Photogenerated I2 Induces I-Rich Phase Formation in Lead Mixed Halide Perovskitescitations
- 2024Understanding Antiferromagnetic Coupling in Lead-Free Halide Double Perovskite Semiconductorscitations
- 2023Wide‐Bandgap Perovskite‐Inspired Materials: Defect‐Driven Challenges for High‐Performance Optoelectronicscitations
- 2023Wide-bandgap perovskite-inspired materials: defect-driven challenges for high-performance optoelectronicscitations
- 2023How Photogenerated I2 Induces I‐rich Phase Formation in Lead Mixed Halide Perovskitescitations
- 2023Critical Insight into Pretransitional Behavior and Dielectric Tunability of Relaxor Ceramicscitations
- 2023Quantum random number generation based on a perovskite light emitting diodecitations
- 2023How to GIWAXS: Grazing Incidence Wide Angle X-Ray Scattering Applied to Metal Halide Perovskite Thin Filmscitations
- 2023How to GIWAXS: Grazing Incidence Wide Angle X‐Ray Scattering Applied to Metal Halide Perovskite Thin Filmscitations
- 2023Neuromorphic computing based on halide perovskitescitations
- 2023Racial Differences in the Association of Glucagon-like Peptide 1 Agonist Use and the Progression of Monoclonal Gammopathy of Undetermined Significance to Multiple Myeloma in US Veterans with Diabetes Mellituscitations
- 2023On‐Chip Tightly Confined Guiding and Splitting of Surface Acoustic Waves Using Line Defects in Phononic Crystalscitations
- 2023Lattice Dynamics and Electron-Phonon Coupling in Double Perovskite Cs2NaFeCl6citations
- 2022Advances in solution-processed near-infrared light-emitting diodescitations
- 2022Development of a High Perfomance Gas Thermoelectric Generator (TEG) with Possibible Use of Waste Heatcitations
- 2021Advances in solution-processed near-infrared light-emitting diodescitations
- 2021In Situ Optical Studies on Morphology Formation in Organic Photovoltaic Blendscitations
- 2021In Situ Optical Studies on Morphology Formation in Organic Photovoltaic Blendscitations
- 2021In Situ Optical Studies on Morphology Formation in Organic Photovoltaic Blendscitations
- 2021The influence of the chemical structure of selected polymers on the properties of ferroelectric ceramic-polymer compositescitations
- 2021Acoustic-radiation free surface phononic crystal resonator for in-liquid low-noise gravimetric detectioncitations
- 2020Magnetizing lead-free halide double perovskitescitations
- 2020Monolithic integration of up to 40 GHz Ge photodetectors in 3μm SOIcitations
- 2019Pulsed Terahertz Emission from Solution-Processed Lead Iodide Perovskite Filmscitations
- 2019Advanced Lateral High Aspect Ratio Test Structures for Conformality Characterization by Optical Microscopy
- 2018PillarHall LHAR structure for Thin Film Conformality Measurements
- 2018Monitoring Conformality in ALD Manufacturing
- 2018Ultra-Bright Near-Infrared Perovskite Light-Emitting Diodes with Reduced Efficiency Roll-offcitations
- 2018Ultra-Bright Near-Infrared Perovskite Light-Emitting Diodes with Reduced Efficiency Roll-offcitations
- 2016Highly conformal TiN by atomic layer deposition:growth and characterization
- 2016Band structure engineering in organic semiconductorscitations
- 2016Nucleation and conformality of iridium and iridium oxide thin films grown by atomic layer depositioncitations
- 2015Microscopic silicon-based lateral high-aspect-ratio structures for thin film conformality analysiscitations
- 2015Implementation of wavelength scanning interferometry for R2R flexible PV barrier films
- 2013Infrared spectroscopy study of a poly-silicon film for optimizing the boron-implanting dosecitations
- 2011Design of Catalytically Active Cylindrical and Macroporous Gold Microelectrodescitations
- 2010Formation of nanopatterned polymer blends in photovoltaic devicescitations
Places of action
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document
Implementation of wavelength scanning interferometry for R2R flexible PV barrier films
Abstract
<p>Roll to Roll manufacture of nano-scale thin film layers faces the challenge of micro/nano-scale defects appearing in the films. Atomic Layer Deposition (ALD) coatings of aluminium oxide, Al<sub>2</sub>O<sub>3</sub> are used as barrier layers for photovoltaic (PV) solar modules where the primary function of the barrier layer is to prevent the water vapour ingress to the PV cells. Barrier layer defects have been shown to have negative impact on the performance of the barrier layers. Poor barriers cause module degradation resulting in reduced PV efficiency and lifespan. In order to ensure the quality of manufacture of the barriers, defects should be detected during the barrier production process and the information used to optimise the production process. This paper introduces, as part of EU funded NanoMend project, a full solution for inspection of entire surface regions of Al<sub>2</sub>O<sub>3</sub> barrier films across large area substrates. The solution principle is based on implementing an opto-mechanical in-process inspection system to measure the significant defects using a wavelength scanning interferometer (WSI) embedded within the film-rewinder stage and integrated with the substrate translation and kinematic stages. The opto-mechanical system allows full surface measurement over full substrate widths of approximately 0.5m. The system provides an auto-focus for the WSI with an accuracy and repeatability better than 6 μm at optimum optical alignment conditions. The system is combined with a porous air-bearing conveyor used to hold the film web at fixed height within the focal depth of WSI objective lens and with height variation of < 5 μm under optimum vacuum pressure. The paper also outlines a computerised data handling process that can be used to assess hundreds/thousands of measurement files automatically by extracting and monitoring the areal root mean square roughness parameter (Sq) and defect statistics. Measurement results for functionally significant defects with lateral size > 3 μm is also presented as a case study to highlight the system capability.</p>