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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Siew, Wh
University of Strathclyde
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Publications (8/8 displayed)
- 2021Influence of octavinyl-polyhedral oligomeric silsesquioxane on the electric treeing resistance of polypropylene
- 2021Octavinyl polyhedral oligomeric silsesquioxane on tailoring the DC electrical characteristics of polypropylenecitations
- 2020Nanocomposites based on magnesium-oxide/aluminum-nitride/polypropylene for HVDC cable insulationcitations
- 2020Effect of different surface treatment agents on the physical chemistry and electrical properties of polyethylene nano-alumina nanocompositescitations
- 2018Filler and additive effects on partial discharge degradation of PET films used in PV devicescitations
- 2018Partial discharge behaviour of biaxially orientated PET filmscitations
- 2016Long term testing and analysis of dielectric samples under DC excitation
- 2013Fault location and diagnosis in a medium voltage EPR power cablecitations
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document
Long term testing and analysis of dielectric samples under DC excitation
Abstract
This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity.After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.