Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Naji, M.
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Shkondin, Evgeniy

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Technical University of Denmark

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (29/29 displayed)

  • 2024Titanium Nitride Nanotrench Metasurfaces for Mid-infrared Chemical Sensing1citations
  • 2023Optical properties of plasmonic titanium nitride thin films from ultraviolet to mid-infrared wavelengths deposited by pulsed-DC sputtering, thermal and plasma-enhanced atomic layer deposition23citations
  • 2022Optical, structural and composition properties of silicon nitride films deposited by reactive radio-frequency sputtering, low pressure and plasma-enhanced chemical vapor deposition55citations
  • 2022Optical, structural and composition properties of silicon nitride films deposited by reactive radio-frequency sputtering, low pressure and plasma-enhanced chemical vapor deposition55citations
  • 2021Thickness-dependent optical properties of aluminum nitride films for mid-infrared wavelengths26citations
  • 2020Microspherical nanoscopy: is it a reliable technique?7citations
  • 2020Microspherical nanoscopy: is it a reliable technique?7citations
  • 2020Fabrication of hollow coaxial Al 2 O 3 /ZnAl 2 O 4 high aspect ratio freestanding nanotubes based on the Kirkendall effect14citations
  • 2020Fabrication of hollow coaxial Al2O3/ZnAl2O4 high aspect ratio freestanding nanotubes based on the Kirkendall effect14citations
  • 2019Doped silicon plasmonic nanotrench structures for mid-infrared molecular sensingcitations
  • 2019Optical properties of titanium nitride films under low temperaturecitations
  • 2019Optical properties of titanium nitride films under low temperaturecitations
  • 2019Cryogenic characterization of titanium nitride thin films24citations
  • 2019Doped silicon plasmonic nanotrench structures for mid-infrared molecular sensingcitations
  • 2019Plasmonic Characterization of Titanium Nitride Films under Low Temperaturescitations
  • 2019Plasmonic Characterization of Titanium Nitride Films under Low Temperaturescitations
  • 2019Lamellas metamaterials: Properties and potential applicationscitations
  • 2019Lamellas metamaterials: Properties and potential applicationscitations
  • 2018Experimental observation of Dyakonov plasmons in the mid-infrared1citations
  • 2017Advanced fabrication of hyperbolic metamaterialscitations
  • 2017Large-scale high aspect ratio Al-doped ZnO nanopillars arrays as anisotropic metamaterials.106citations
  • 2017Highly ordered Al-doped ZnO nano-pillar and tube structures as hyperbolic metamaterials for mid-infrared plasmonicscitations
  • 2016Fabrication of Hyperbolic Metamaterials using Atomic Layer Depositioncitations
  • 2016Fabrication of high aspect ratio TiO2 and Al2O3 nanogratings by atomic layer deposition45citations
  • 2016Conductive Oxides Trench Structures as Hyperbolic Metamaterials in Mid-infrared Rangecitations
  • 2016Fabrication of high aspect ratio TiO 2 and Al 2 O 3 nanogratings by atomic layer deposition45citations
  • 2016Fabrication of deep-profile Al-doped ZnO one- and two-dimensional lattices as plasmonic elementscitations
  • 2015Ultra-thin Metal and Dielectric Layers for Nanophotonic Applications2citations
  • 2014Depositing Materials on the Micro- and Nanoscalecitations

Places of action

Chart of shared publication
Takayama, Osamu
26 / 32 shared
Lavrinenko, Andrei V.
20 / 98 shared
Beliaev, Leonid Yu
3 / 3 shared
Laurynenka, Andrei
6 / 14 shared
Beliaev, Leonid
2 / 3 shared
Malureanu, Radu
8 / 51 shared
Novitsky, Andrey
2 / 13 shared
Jensen, Flemming
12 / 32 shared
Alimadadi, Hossein
2 / 22 shared
Vertchenko, Larissa
7 / 7 shared
Dib, Sarah Elisabeth Hussein El
1 / 1 shared
Leandro, Lorenzo
6 / 6 shared
Akopian, Nika
5 / 7 shared
Bondarev, Igor V.
1 / 1 shared
El Dib, Sarah Elisabeth Hussein
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Repän, Taavi
3 / 8 shared
Sukham, Johneph
3 / 4 shared
Dmitriev, P.
1 / 1 shared
Yermakov, O.
1 / 1 shared
Golenitskii, K.
1 / 1 shared
Panah, M.
1 / 1 shared
Bodganov, A.
1 / 1 shared
Panah, Mohammad Esmail Aryaee
4 / 6 shared
Mar, Mikkel Dysseholm
6 / 6 shared
Liu, Pei
2 / 4 shared
Larsen, Pernille Voss
5 / 5 shared
Michael-Lindhard, Jonas
2 / 4 shared
Lavrinenko, Andrei
1 / 32 shared
Rozlosnik, Noemi
1 / 6 shared
Pholprasit, Patama
1 / 1 shared
Herstrøm, Berit
1 / 2 shared
Chart of publication period
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Co-Authors (by relevance)

  • Takayama, Osamu
  • Lavrinenko, Andrei V.
  • Beliaev, Leonid Yu
  • Laurynenka, Andrei
  • Beliaev, Leonid
  • Malureanu, Radu
  • Novitsky, Andrey
  • Jensen, Flemming
  • Alimadadi, Hossein
  • Vertchenko, Larissa
  • Dib, Sarah Elisabeth Hussein El
  • Leandro, Lorenzo
  • Akopian, Nika
  • Bondarev, Igor V.
  • El Dib, Sarah Elisabeth Hussein
  • Repän, Taavi
  • Sukham, Johneph
  • Dmitriev, P.
  • Yermakov, O.
  • Golenitskii, K.
  • Panah, M.
  • Bodganov, A.
  • Panah, Mohammad Esmail Aryaee
  • Mar, Mikkel Dysseholm
  • Liu, Pei
  • Larsen, Pernille Voss
  • Michael-Lindhard, Jonas
  • Lavrinenko, Andrei
  • Rozlosnik, Noemi
  • Pholprasit, Patama
  • Herstrøm, Berit
OrganizationsLocationPeople

conferencepaper

Depositing Materials on the Micro- and Nanoscale

  • Mar, Mikkel Dysseholm
  • Pholprasit, Patama
  • Jensen, Flemming
  • Shkondin, Evgeniy
  • Herstrøm, Berit
Abstract

Micro- and nanotechnology systems are important in many sustainable products like solar cells and chemical, mechanical and optical sensors. Keeping the systems small will make a smaller demand for material and energy during production and also a smaller demand for energy during use. In these systems thin films of different kind are important parts of giving the system the properties needed. This can be properties like light absorbing layers, antireflection coatings or conductive layers in solar cells. It can be low stress layers in membranes, chemicals resistant layers in chemical sensors, layers with specific optical properties in optical sensors, piezoelectric thin films or insulating layers in many other applications. These different materials and properties impose a demand for different kind of deposition techniques. At DTU Danchip we have a large variety of these deposition techniques that can be used separately or in combination to give the micro/nano system the properties needed. These techniques and film properties are presented.ALD (Atomic Layer Deposition) is good for very thin films (down to monolayers) with extremely good stepcoverage and extremely good control of the layer thickness. LPCVD (Low Pressure Chemical Deposition) is good for dielectric layers for optical components, light absorbing layers, membranes and cantilevers. The processes take place at high temperature and create highquality films with high step coverage. PECVD (Plasma Enhanced Chemical Vapor Deposition) is good for fabricating dielectric layers for opticalcomponents and insulation layers. The layers are deposited at relative low temperature (300C). Sputter deposition deposits almost any material (metals and dielectrics including alloys) at low temperaturewith good step coverage. E-beam evaporation is good for high quality thin film metal deposition e.g. for electrical leads or surfaceplasmonic devices. MVD (Molecular Vapor Deposition) is used for making anti stiction coating.Below is shown an example of Atomic Layer Deposition which is a self-terminating chemical vapor deposition technique based on sequential introduction of precursor pulses with intermediate purging steps. The process proceeds by specific surface ligand-exchange reactions and this leads to layer-by-layer growth control. No other thin film deposition technique can approach the conformity achieved by ALD on high aspect ratio structures.The figure shows 4 μm deep Sitrenches with the period of 400 nm, coated with ALD TiO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub>multilayers. The insets show highresolution SEM images of top and bottom parts of coating.This is an example of extremely high conformity deposition of multilayer thin films on high aspect ratio structure.

Topics
  • impedance spectroscopy
  • surface
  • scanning electron microscopy
  • thin film
  • evaporation
  • chemical vapor deposition
  • atomic layer deposition