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Julkarnain, M. D.
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article
Temperature effect on the electrical properties of chromium oxide (Cr 2O3) thin films
Abstract
<p>Chromium Oxide (Cr<sub>2</sub>O<sub>3</sub>) thin films have been prepared by thermal evaporation onto glass substrate at a pressure of about 6×10<sup>-4</sup> Pa. Structural and compositional analysis has been carried out by XRD, SEM and EDAX method. The heating and cooling cycles of the samples are reversible in the investigated temperature range after successive heat-treatment in air. Temperature dependence of electrical conductivity shows a semiconducting behavior. The thickness dependence of conductivity is well in conformity with the Fuchs-Sondheimar theory. The Hall coefficient shows a positive sign exhibiting p-type carriers. Optical study has been employed to determine the band gap of the samples.</p>