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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Ray, Samit Kumar
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Publications (5/5 displayed)
- 2023Ni<sub>6</sub>Se<sub>5</sub>, an unexplored transition metal chalcogenide of formula M<sub>(n+1)</sub>X <sub>n</sub> (2 ≤ n ≤ 8), for high-performance hybrid supercapacitor and Li-ion battery applicationcitations
- 2016Studies on nanotribological and oxidation resistance properties of yttria stabilized zirconia (YSZ), alumina (Al2O3) based thin films developed by pulsed laser depositioncitations
- 2016Development and characterization of yttria stabilized zirconia and Al2O3 thin films by pulsed laser deposition
- 2015Phase Structure and Microstructure Of Yttria Stabilized Zirconia Thin Film Developed By Pulsed Laser Deposition
- 2013Studies on yttria stabilized zirconia coating developed by pulsed laser deposition
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document
Phase Structure and Microstructure Of Yttria Stabilized Zirconia Thin Film Developed By Pulsed Laser Deposition
Abstract
In the present study, structural characterization of yttria stabilized zirconia (YSZ) thin film developed by pulsed laser deposition under optimum condition has been undertaken. The X-ray diffraction analysis of precursor YSZ powder used for the preparation of target showed presence of mixture of monoclinic as well as tetragonal zirconia. The YSZ thin films were deposited at different substrate temperature starting from room temperature to a maximum substrate temperature of 700 °C. The YSZ thin film deposited at substrate temperature of 700 °C have been found to the optimum temperature for deposition of YSZ thin film. The developed YSZ thin film showed presence of single phase tetragonal zirconia. The microstructural analysis reveals that the structure is very dense with the thickness 1.4 ± 0.2 m.