Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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Verdingovas, Vadimas

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2020Influence of Ni, Bi, and Sb additives on the microstructure and the corrosion behavior of Sn–Ag–Cu solder alloys20citations
  • 2019Electrochemical Impedance Spectroscopy (EIS) for Monitoring the Water Load on PCBAs Under Cycling Condensing Conditions to Predict Electrochemical Migration Under DC Loads3citations
  • 2018Humidity-related failures in electronics: effect of binary mixtures of weak organic acid activators32citations
  • 2018Corrosion Reliability of Lead-Free Solder Systems Used in Electronics6citations
  • 2017Corrosion reliability of lead-free solder systems used in electronics5citations
  • 2015Effect of iodine on the corrosion of Au-Al wire bonds20citations
  • 2014Corrosion in electronics: Overview of failures and countermeasurescitations
  • 2013Decomposition studies of no-clean solder flux systems in connection with corrosion reliability of electronicscitations

Places of action

Chart of shared publication
Li, Feng
3 / 14 shared
Dirscherl, Kai
2 / 9 shared
Ambat, Rajan
8 / 142 shared
Medgyes, Bálint
1 / 4 shared
Harsányi, Gábor
1 / 1 shared
Richter, Theresia
1 / 1 shared
Lauser, Simone
1 / 1 shared
Piotrowska, Kamila
2 / 11 shared
Medgyes, Balint
2 / 2 shared
Grumsen, Flemming Bjerg
1 / 33 shared
Müller, Lutz
1 / 3 shared
Jellesen, Morten Stendahl
3 / 58 shared
Conseil, Helene
2 / 5 shared
Chart of publication period
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Co-Authors (by relevance)

  • Li, Feng
  • Dirscherl, Kai
  • Ambat, Rajan
  • Medgyes, Bálint
  • Harsányi, Gábor
  • Richter, Theresia
  • Lauser, Simone
  • Piotrowska, Kamila
  • Medgyes, Balint
  • Grumsen, Flemming Bjerg
  • Müller, Lutz
  • Jellesen, Morten Stendahl
  • Conseil, Helene
OrganizationsLocationPeople

document

Corrosion in electronics: Overview of failures and countermeasures

  • Piotrowska, Kamila
  • Verdingovas, Vadimas
  • Jellesen, Morten Stendahl
  • Conseil, Helene
  • Ambat, Rajan
Abstract

Many field failure returns of electronics are marked as “no failure found”, yet numerous of these failures are likely due to corrosion, since corrosion related failures are not easily detected during subsequent failure analysis. In some cases failures are intermittent and occur because of service life conditions (humidity and contamination) where water film formation on the printed circuit board assembly (PCBA) leads to leakage currents resulting in wrong output signal of the electronic device. If the leakage current itself will not result in malfunctioning of the electronics, the formed water film and potential bias of the PCBA will eventually lead to failure caused by more easy recognisable corrosion. Typical corrosion failure types seen in electronics are galvanic corrosion, electrochemical migration, and other types of bias induced corrosion.<br/>This paper describes the most commonly used metals and alloys in electronic devices including aluminium, gold, copper, silver, tin, lead and their alloys. Galvanic series performed in a flux solution is presented together with examples of galvanic corrosion causing failure of electronics. Failures that find root cause in the manufacturing process are described in details, e.g. flux activator related failures. Failures caused by service life conditions with high humidity and sulphur containing gaseous environments are also described. Finally it is described how the architecture of the PCBA (the placement of components) will affect its corrosion reliability. Infrared camera imaging is used to show the thermal distribution of the PCBA during power on periods and can reveal local cold spots on the PCBA being prone to condensation and corrosion.

Topics
  • impedance spectroscopy
  • silver
  • aluminium
  • gold
  • copper
  • tin
  • galvanic corrosion
  • Sulphur