Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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Naji, M.
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Liu, Xiaolong

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Aalto University

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (13/13 displayed)

  • 2024Wetting Properties of Black Silicon Layers Fabricated by Different Techniques3citations
  • 2024(invited talk) Sulfur-hyperdoped silicon by ultrashort laser processingcitations
  • 2024Contactless analysis of surface passivation and charge transfer at the TiO 2-Si interface2citations
  • 2024Contactless analysis of surface passivation and charge transfer at the TiO 2-Si interface2citations
  • 2024Impact of post-ion implantation annealing on Se-hyperdoped Ge1citations
  • 2024Impact of post-ion implantation annealing on Se-hyperdoped Ge1citations
  • 2024Bridging the gap between surface physics and photonics2citations
  • 2024Contactless analysis of surface passivation and charge transfer at the TiO2-Si interface2citations
  • 2023(oral talk) Effective carrier lifetime in ultrashort pulse laser hyperdoped silicon: dopant concentration dependence and practical upper limitscitations
  • 2023Excellent Responsivity and Low Dark Current Obtained with Metal-Assisted Chemical Etched Si Photodiode4citations
  • 2023Properties of Black Silicon Layers Fabricated by Different Techniques for Solar Cell Applications8citations
  • 2022Perspectives on Black Silicon in Semiconductor Manufacturing: Experimental Comparison of Plasma Etching, MACE and Fs-Laser Etching32citations
  • 2022Millisecond-Level Minority Carrier Lifetime in Femtosecond Laser-Textured Black Silicon11citations

Places of action

Chart of shared publication
Ayvazyan, Gagik
2 / 3 shared
Savin, Hele
12 / 75 shared
Vardanyan, Arman
1 / 1 shared
Hakhoyan, Levon
2 / 2 shared
Seibt, Michael
1 / 14 shared
Radfar, Behrad
8 / 9 shared
Paulus, Simon
2 / 3 shared
Niemeyer, Tobias
1 / 1 shared
Schäfer, Sören
4 / 6 shared
Koskinen, Vesa
1 / 1 shared
Vähänissi, Ville
11 / 43 shared
Kontermann, Stefan
4 / 8 shared
Kearney, Patrick Mc
3 / 3 shared
Mutschall, Doris
1 / 2 shared
Serue, Michael
2 / 2 shared
Pasanen, Hannu P.
3 / 6 shared
Ali-Löytty, Harri
3 / 44 shared
Khan, Ramsha
3 / 13 shared
Tkachenko, Nikolai V.
3 / 19 shared
Berencen, Yonder
2 / 4 shared
Kentsch, Ulrich
2 / 7 shared
Zhou, Shengqiang
2 / 15 shared
Mc Kearney, Patrick
1 / 2 shared
Punkkinen, Marko
1 / 6 shared
Kuzmin, Mikhail
1 / 10 shared
Kokko, Kalevi
1 / 10 shared
Hakkarainen, Teemu
1 / 5 shared
Viheriälä, Jukka
1 / 2 shared
Guina, Mircea
1 / 36 shared
Tukiainen, Antti
1 / 23 shared
Laukkanen, Pekka
1 / 11 shared
Setälä, Olli E.
2 / 4 shared
Pasanen, Toni P.
3 / 21 shared
Heinonen, Juha
1 / 2 shared
Chen, Kexun
3 / 7 shared
Ayvazyan, Karen
1 / 1 shared
Yli-Koski, Marko
1 / 7 shared
Pälikkö, Elmeri
1 / 1 shared
Chart of publication period
2024
2023
2022

Co-Authors (by relevance)

  • Ayvazyan, Gagik
  • Savin, Hele
  • Vardanyan, Arman
  • Hakhoyan, Levon
  • Seibt, Michael
  • Radfar, Behrad
  • Paulus, Simon
  • Niemeyer, Tobias
  • Schäfer, Sören
  • Koskinen, Vesa
  • Vähänissi, Ville
  • Kontermann, Stefan
  • Kearney, Patrick Mc
  • Mutschall, Doris
  • Serue, Michael
  • Pasanen, Hannu P.
  • Ali-Löytty, Harri
  • Khan, Ramsha
  • Tkachenko, Nikolai V.
  • Berencen, Yonder
  • Kentsch, Ulrich
  • Zhou, Shengqiang
  • Mc Kearney, Patrick
  • Punkkinen, Marko
  • Kuzmin, Mikhail
  • Kokko, Kalevi
  • Hakkarainen, Teemu
  • Viheriälä, Jukka
  • Guina, Mircea
  • Tukiainen, Antti
  • Laukkanen, Pekka
  • Setälä, Olli E.
  • Pasanen, Toni P.
  • Heinonen, Juha
  • Chen, Kexun
  • Ayvazyan, Karen
  • Yli-Koski, Marko
  • Pälikkö, Elmeri
OrganizationsLocationPeople

document

(invited talk) Sulfur-hyperdoped silicon by ultrashort laser processing

  • Seibt, Michael
  • Savin, Hele
  • Radfar, Behrad
  • Paulus, Simon
  • Liu, Xiaolong
  • Niemeyer, Tobias
  • Schäfer, Sören
  • Koskinen, Vesa
  • Vähänissi, Ville
  • Kontermann, Stefan
  • Kearney, Patrick Mc
  • Mutschall, Doris
  • Serue, Michael
Abstract

Hyperdoping of semiconductors can be used to shift the optical band gap towards lower energies and thereby extend the optical response of a material like Si further into the infrared. This makes the approach attractive for opto-electronic applications, e.g. photodiodes or intermediate band solar cells. Here, we study the hyperdoping of Si with sulfur that we obtain by placing the Si substrate in a sulfur containing atmosphere and subsequent irradiation by a multitude of ultrashort laser pulses. We present an overview of our key findings regarding the so obtained material system and elaborate on remaining challenges and promising perspectives.<br/><br/>We evaluate the correlation of laser process parameters like effective pulse density, laser fluence and pulse duration as well as different and customized post-hyperdoping treatments on structural, optical, and electrical material properties. The structural properties are studied by transmission electron microscopy and Raman spectroscopy, optical properties by absorptance measurements and electrical properties by the effective minority carrier lifetime and current-voltage (I-V) measurements. In case of the carrier lifetime, we apply an Al2O3 surface passivation by atomic layer deposition (ALD) to reduce the surface recombination rate and, thus, to become more sensitive to changes within the hyperdoped bulk. For I-V measurements, we deposit ohmic metal contacts. Challenges for both surface passivation and metallization that result from the surface roughness of the material are discussed. We furthermore implement the material into a photodetector device and characterize its performance in the sub-bandgap spectral region up to 5µm.

Topics
  • density
  • surface
  • semiconductor
  • transmission electron microscopy
  • Silicon
  • Raman spectroscopy
  • atomic layer deposition