Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2000Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cablescitations

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Chart of shared publication
Kalkner, W.
1 / 2 shared
Pommerenke, David
1 / 10 shared
Jobava, R.
1 / 2 shared
Heinrich, R.
1 / 2 shared
Chart of publication period
2000

Co-Authors (by relevance)

  • Kalkner, W.
  • Pommerenke, David
  • Jobava, R.
  • Heinrich, R.
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article

Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

  • Kalkner, W.
  • Pommerenke, David
  • Jobava, R.
  • Heinrich, R.
  • Bönisch, S.
Abstract

<p>The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.</p>

Topics
  • semiconductor